Abstract:A novel evaluation method for variety of the dielectric materials with low or high losses is reported. The proposed evaluation method is based on the hybrid numerical method [1] combining the extended spectral domain approach with mode-matching method. This does not include any approximation unlike in the case of the perturbation scheme. The sample may be a columnar structure with the arbitrarily cross section and electrically large or small, and it is placed at arbitrarily position in the waveguide. The size … Show more
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