1958
DOI: 10.1103/physrev.109.1098
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Weak-Field Magnetoresistance inp-Type Silicon

Abstract: Measurements of the three weak-field magnetoresistance coefficients and the Hall mobility have been made at a number of different temperatures between 77°K and 350°K on ^-type silicon samples ranging in resistivity from 0.15 to 115 ohm-cm. The results indicate a marked temperature dependence of the anisotropics of the energy band structure and/or the scattering. The weak-field magnetoresistance coefficients happen to satisfy nearly the same symmetry relations above about 275 °K as those satisfied by n-type ger… Show more

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Cited by 20 publications
(3 citation statements)
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“…For hole carriers, correctly, we obtain a behavior opposite to electrons, μ H <μ d in the entire temperature range and thus a Hall factor r < 1. Our computed low-field MR coefficient, MR/B 2 , is 7.74 × 10 5 cm 4 /V 2 s 2 for holes at 300 K, within 30% of the measured value of 5.90 × 10 5 cm 4 /V 2 s 2 [54]. For hole carriers, we find that calculations without SOC fail to produce an isotropic conductivity tensor, a key sanity check for Si (for electrons, SOC has only a minor effect).…”
Section: A Siliconsupporting
confidence: 82%
“…For hole carriers, correctly, we obtain a behavior opposite to electrons, μ H <μ d in the entire temperature range and thus a Hall factor r < 1. Our computed low-field MR coefficient, MR/B 2 , is 7.74 × 10 5 cm 4 /V 2 s 2 for holes at 300 K, within 30% of the measured value of 5.90 × 10 5 cm 4 /V 2 s 2 [54]. For hole carriers, we find that calculations without SOC fail to produce an isotropic conductivity tensor, a key sanity check for Si (for electrons, SOC has only a minor effect).…”
Section: A Siliconsupporting
confidence: 82%
“…For hole carriers, correctly, we obtain a behavior opposite to electrons, µ H < µ d in the entire temperature range and thus a Hall factor r < 1. Our computed low field MR coefficient, MR/B 2 , is 6.46 • 10 5 cm 4 /V 2 s 2 for holes at 300 K, within 10% of the measured value of 5.90 • 10 5 cm 4 /V 2 s 2 [53]. These results show that including SOC makes accurate magnetotransport calculations possible for hole carriers in semiconductors.…”
Section: A Siliconsupporting
confidence: 80%
“…The negative TMR has been already observed in p-type Si 60 years ago [35][36][37]. However, there exists no reasonable explanation for p-type Si exhibiting the negative TMR.…”
Section: Comparison With Experimentsmentioning
confidence: 94%