Well-crystallized nitrogen-rich graphitic carbon nitride nanocrystallites prepared via solvothermal route at low temperature

Zhang, Jian; Liu, Wei; Li, Xuefei; Zhan, Baoqing; Cui, Qiliang; Zou, Guangtian

doi:10.1016/j.materresbull.2008.06.009

Cited by 26 publications

(15 citation statements)

References 24 publications

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“…1-5. The assignments to possible peak position from literatures for different bonding configurations 3,12,19,20,27,[39][40][41][42][43][44][45][46] are also shown in those figures. The film thickness, atomic percentage (At%), and ratio of the atoms in ion implanted layers are given in Table III.…”

Section: Resultsmentioning

confidence: 99%

“…12,19,27,40 N1s peaks for both cases seem to be combination of three bonding structures. The possible peaks could be assigned to N atoms having two C neighbors at 398.4 eV [N-C(1)], N atoms having three C neighbors at 400.0 eV [N-C(2)] [42][43][44][45] and N bonded with other N atoms or suggest some trapped N 2 at 402.5 eV. 43 It is very clear from Figs.…”

Section: -6mentioning

confidence: 99%

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Bias in bonding behavior among boron, carbon, and nitrogen atoms in ion implanted a-BN, a-BC, and diamond like carbon films

Genişel

Uddin

Say

et al. 2011

Journal of Applied Physics

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In this study, we implanted N + and N 2 + ions into sputter deposited amorphous boron carbide (a-BC) and diamond like carbon (DLC) thin films in an effort to understand the chemical bonding involved and investigate possible phase separation routes in boron carbon nitride (BCN) films. In addition, we investigated the effect of implanted C + ions in sputter deposited amorphous boron nitride (a-BN) films. Implanted ion energies for all ion species were set at 40 KeV. Implanted films were then analyzed using x-ray photoelectron spectroscopy (XPS). The changes in the chemical composition and bonding chemistry due to ion-implantation were examined at different depths of the films using sequential ion-beam etching and high resolution XPS analysis cycles. A comparative analysis has been made with the results from sputter deposited BCN films suggesting that implanted nitrogen and carbon atoms behaved very similar to nitrogen and carbon atoms in sputter deposited BCN films. We found that implanted nitrogen atoms would prefer bonding to carbon atoms in the films only if there is no boron atom in the vicinity or after all available boron atoms have been saturated with nitrogen. Implanted carbon atoms also preferred to either bond with available boron atoms or, more likely bonded with other implanted carbon atoms. These results were also supported by ab-initio density functional theory calculations which indicated that carbon-carbon bonds were energetically preferable to carbon-boron and carbon-nitrogen bonds. © 2011 American Institute of Physics

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Section: Resultsmentioning

confidence: 99%

Section: -6mentioning

confidence: 99%

Bias in bonding behavior among boron, carbon, and nitrogen atoms in ion implanted a-BN, a-BC, and diamond like carbon films

Genişel

Uddin

Say

et al. 2011

Journal of Applied Physics

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“…These assignments are based on thin film results [39, 44–45, 60–69], cyanogen polymerization [50, 70], thermal degradation of explosives [35], development of adsorbents [71, 72], sensors [73], and new materials [74–77].…”

Section: Discussionmentioning

confidence: 99%

LX‐17 Thermal Decomposition‐Characterization of Solid Residues from Cook‐Off in a Small‐Scale Vessel Under Confinement

Reynolds

Muetterties

Nelson

et al. 2021

Propellants Explo Pyrotec

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Concerns surround whether insensitive (or any) energetic materials are more dangerous to handle when exposed to abnormal thermal environments. This study characterizes the residual material remaining after LX‐17 (92.5 % 1,3,5‐triamino 2,4,6‐trinitro benzene (TATB) and 7.5 % Kel‐F) is exposed to various thermal environments in a sealed small‐scale vessel cook‐off test reactor (heated at 0.1 to 100 °C/min until the reactor opened at 3000 psi (20.7 MPa)). Previous work has shown no additional sensitivity of these residues as evaluated by small‐scale safety analysis, but characterization on the molecular scale indicates the TATB is transformed to more reactive compounds as well as the residue could be precursors to toxic gases. The solids and chars were characterized by various analytical methods. Heat‐flow measurements indicated exothermic release is due to a mixture of residual TATB and related decomposition products (which may be more energetic). The N/C and O/N ratios indicated a material much more degraded than TATB. Primarily, the solids were a network of amorphous C inter‐dispersed with N and O. Types of bonding include C−C, C−N, N−H, N−C, N=C, N≡C, C−O=, and −OH. Solvent extracts of the solids showed TATB decomposition intermediates benzo‐furazans and benzo‐furoxans, substituted TATB (mono‐nitroso, hydroxyl, and chlorinated) along with several unidentified smaller molecules. These results indicate thermal treatment produces an amorphous carbon residue with heteroatoms incorporated through differing functionality, varying depending upon the thermal severity of exposure. These structures also could further decompose producing toxic light gases (such as cyanide).

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“…Following the "harder than diamond" postulate from Liu and Cohen in 1989 for cubic carbon nitride [1], many synthetic approaches have been explored to yield this hypothetical structure, including physical methods (e.g., atmospheric-pressure chemical processes, ion-beam deposition, laser techniques, chemical vapor deposition, and reactive sputtering) [2][3][4] and chemical routes (e.g., thermal condensation of molecular precursors) [5][6][7][8][9][10]. Whereas physical methods resulted in mostly amorphous carbon nitrides with insufficient nitrogen content, chemical routes seemed to be more successful.…”

Section: Introductionmentioning

confidence: 99%

Laser ablation of molecular carbon nitride compounds

Fischer¹,

Schwinghammer²,

Sondermann³

et al. 2015

Applied Surface Science

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Well-crystallized nitrogen-rich graphitic carbon nitride nanocrystallites prepared via solvothermal route at low temperature

Cited by 26 publications

References 24 publications

Bias in bonding behavior among boron, carbon, and nitrogen atoms in ion implanted a-BN, a-BC, and diamond like carbon films

Bias in bonding behavior among boron, carbon, and nitrogen atoms in ion implanted a-BN, a-BC, and diamond like carbon films

LX‐17 Thermal Decomposition‐Characterization of Solid Residues from Cook‐Off in a Small‐Scale Vessel Under Confinement

Laser ablation of molecular carbon nitride compounds

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