Abstract:ReflectiveFourier ptychographic microscopy has much potential for industrial surface inspection due to the ability to overcome the physical limits of the numerical aperture of the optical microscopy. However, the time cost for misalignment calibration and Fourier ptychography (FP) recovery has been a big issue for industrial applications which require fast output. Here, we introduce a misalignment estimation method which is accelerated through the whale optimization algorithm by running in parallel on Central … Show more
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