1998
DOI: 10.1016/s0042-207x(98)00081-5
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Wide band-gap II–VI compounds—can efficient doping be achieved?

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Cited by 16 publications
(3 citation statements)
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“…High crystalline and optical quality ZnTe epilayers on VGF-grown ZnTe substrates have been now demonstrated by both molecular beam epitaxy (MBE) [4] and metalorganic vapour phase epitaxy (MOVPE) [5][6][7]. ZnTe crystals usually exhibit p-type conductivity and a strong tendency to compensate donor dopant impurities [8,9]. Still, n-type ZnTe epilayers (with RT electron concentrations up to 4×10…”
Section: Introductionmentioning
confidence: 99%
“…High crystalline and optical quality ZnTe epilayers on VGF-grown ZnTe substrates have been now demonstrated by both molecular beam epitaxy (MBE) [4] and metalorganic vapour phase epitaxy (MOVPE) [5][6][7]. ZnTe crystals usually exhibit p-type conductivity and a strong tendency to compensate donor dopant impurities [8,9]. Still, n-type ZnTe epilayers (with RT electron concentrations up to 4×10…”
Section: Introductionmentioning
confidence: 99%
“…II-VI group semiconductors of CdTe, CdSe, CdS, ZnSe, and ZnTe require to be doped to be applied in device fabrication like a solar cell. Generally, the compound semiconductors of ZnSe, CdSe, and CdS can easily be doped on the n-side, ZnTe on the p-side, and CdTe on both the p-and n-side [141,142]. The ability to be doped with both carrier-type doping makes it available and beneficial in making homo-and hetero-junction devices [142].…”
Section: Doping Of Ii-vi Semiconductors and Compoundsmentioning
confidence: 99%
“…In principle, the higher conduction band minimum than the potential of hydrogen evolution reaction (HER) and the wide solar spectral response make CdS and CdSe promising candidates for water splitting. Unfortunately, undoped CdS and CdSe can only serve as the photoanode for oxygen evolution reaction (OER) due to their natural n‐type polarity . Similar to many nonoxide materials, the application of CdS and CdSe in water splitting is also devalued by heavy anodic photocorrosion at the semiconductor/electrolyte interface .…”
Section: Introductionmentioning
confidence: 99%