1996
DOI: 10.1103/physrevb.53.16510
|View full text |Cite
|
Sign up to set email alerts
|

X-ray-absorption spectroscopy ofCoSi2

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
14
0

Year Published

1997
1997
2024
2024

Publication Types

Select...
6
1

Relationship

2
5

Authors

Journals

citations
Cited by 11 publications
(16 citation statements)
references
References 30 publications
2
14
0
Order By: Relevance
“…The threshold energy and general line-shape of the Si K -edge XANES spectra of the S-hyperdoped Si samples are similar to that of the reference Si(100). The characteristic double-peak feature (indicated by two dashed lines, denoted as feature A 2 ) of S-hyperdoped Si samples and reference Si(100) above the threshold and its approximate 1.1 eV energy separation are consistent with earlier studies 32 33 34 35 . Hitchcock et al .…”
Section: Resultssupporting
confidence: 89%
“…The threshold energy and general line-shape of the Si K -edge XANES spectra of the S-hyperdoped Si samples are similar to that of the reference Si(100). The characteristic double-peak feature (indicated by two dashed lines, denoted as feature A 2 ) of S-hyperdoped Si samples and reference Si(100) above the threshold and its approximate 1.1 eV energy separation are consistent with earlier studies 32 33 34 35 . Hitchcock et al .…”
Section: Resultssupporting
confidence: 89%
“…All fluorescence measurements for the N K-edge x-ray absorption near edge structure ͑XANES͒ spectra were performed using a seven-element Ge detector. Photon energies for C, N, and Si K-edge XANES measurements were calibrated using the bulk diamond, 10 the well known CaF 2 thin film and the crystalline Si͑100͒ film, 11 respectively. The typical resolution of the spectra was 0.2 eV for HSGM and 0.7 eV for DCM beamlines.…”
Section: Methodsmentioning
confidence: 99%
“…3 by a dotted line, is also present at about 4 eV above the L 3 edge, located at 779.4 eV. The XAS spectra, which clearly show no trace of cobalt silicides [ 30 31 ], are characteristic of metallic Co [ 32 ]. Such a lineshape has been seen in numerous structures composed of a thin Co layer grown on a metallic substrate [ 1 , 4 , 32 34 ] or an insulating support [ 35 ].…”
Section: Resultsmentioning
confidence: 99%
“…Although the shoulder at +4 eV from the L 3 edge can be observed for other Co nanostructures (e.g., an ultrathin 1.25 ML Co film grown on Rh(111) [ 33 ] or a superlattice of 0.35 ML 2D Co nanoparticles on Au(788) [ 4 ]) this feature is more pronounced in the case of our Co nanolines, especially for low Co coverage. It seems reasonable to exclude the formation of a Co silicide or a Co oxide, since in these cases, a more structured absorption spectrum is expected [ 30 , 36 37 ]. The XAS signal around this energy may be enhanced by the presence of interface states for Co atoms located at the Co/Si interface as suggested by Pong et al [ 30 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation