X-ray Detectors Based on Halide Perovskite Materials

Abstract

Halide perovskite has remarkable optoelectronic properties, such as high atomic number, large carrier mobility-lifetime product, high X-ray attenuation coefficient, and simple and low-cost synthesis process, and has gradually developed into the next-generation X-ray detection materials. Halide perovskite-based X-ray detectors can improve the sensitivity and reduce the detectable X-ray dose, which is applied in imaging, nondestructive industrial inspection, security screening, and scientific research. In this article, we introduce the fabrication methods of halide perovskite film and the classification and progress of halide perovskite-based X-ray detectors. Finally, the existing challenges are discussed, and the possible directions for future applications are explored. We hope this review can stimulate the further improvement of perovskite-based X-ray detectors.

Perovskite materials in X-ray detection and imaging: recent progress, challenges, and future prospects

“…In contrast, the ALS method can successfully develop dense, highly crystalline perovskite films with low defects. 108 For example, W. Qian and research team demonstrated the application of the ALS method to facilitate the growth of s uniform CsPbI 2 Br-based perovskite film for radiation detection and they showed that the thickness and grain size of the film were enhanced steadily with an increment in the growth time. 109 Fig.…”

Special Issue “Application of Advanced Quantum Dots Films in Optoelectronics”

“…Halide perovskite has remarkable optoelectronic properties, such as high atomic number, large carrier mobility-lifetime product, high X-ray attenuation coefficient, and simple and lowcost synthesis process, and has gradually developed into a next-generation X-ray detection material. In the work by Tan et al, the fabrication methods of halide perovskite film and the development progress of halide-perovskite-based X-ray detectors were introduced [8].…”