X-Ray Diffraction Investigations of NdGaO₃Single Crystal

Abstract

Neodymium gallium perovskite single crystals grown with the Czochralski method were examined with several complementary X-ray methods. By means of X-ray diffraction topography and reciprocal space diagram the structural perfection and crystal homogeneity of the studied wafers were determined. Additionally, the results of the X-ray reflectometry investigations of the surface perfection after the mechanochemical treatment are presented.

X-ray high-resolution diffraction and reflectivity studies of defects related to the mechanical treatment of single crystals

“…Neodymium gallium perovskite single crystals are a suitable substrate material for the growth of untwinned (001) oriented YBa 2 Cu 3 O x thin films [1,2]. In addition NdGaO 3 is proposed as a substrate for the growth of GaN epitaxal layers.…”