X-Ray Diffraction Topography Methods (Review)

Лидер, В. В.

doi:10.1134/s1063783421020141

Cited by 16 publications

(11 citation statements)

References 176 publications

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“…The samples were ingots with a diameter of 35 mm and height of 12 mm. The SR beam was limited by slit with a width of 50 µm, which made it possible to avoid the superposition of images of many defects in the sample bulk on one 2D projection [5]. The film registered images of defects inside the layer corresponding to the cross-section of the crystal by a narrow SR beam.…”

Section: Examples Of Use Of Synchrotron Radiation In Section Topograp...mentioning

confidence: 93%

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Section methods of X-Ray diffraction topography

et al. 2022

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X-ray topography is a group of methods for obtaining diffraction images of structural defects in crystals. Among them, section topography techniques are distinguished by their abilities in acquiring quantitative information about defects based on the analysis of the images. For this purpose, special applications of the dynamic theory of X-ray diffraction are being developed. The interference of wave fields excited in a crystal by an X-ray beam is the basis of the section methods. Their sensitivity to weak lattice distortions is much higher than that of other X-ray methods. This review describes the physical foundations and implementation of the section topography techniques, as well as the results of computer simulating the wave field in a crystal. We present some examples of solving materials science and microelectronics problems and briefly describe the section topography using synchrotron radiation. Keywords: X-ray topography, single crystals, defects in crystals, silicon, diamond, indium antimonide.

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Section: Examples Of Use Of Synchrotron Radiation In Section Topograp...mentioning

confidence: 93%

“…Note that various modifications of Lang's section method in which these conditions are not met (for example, when using laboratory radiation sources they include the stopframe method, the method of limited projections, etc.) are not considered in this review [5].…”

Section: Conditions For Implementing Section Methodsmentioning

confidence: 99%

Section methods of X-Ray diffraction topography

et al. 2022

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“…The application of XRDT (Tanner, 2013;Lider, 2021) allows one to visualize the distribution of defects and strains with up to micrometre spatial resolution. The spatial resolution is restricted by the X-ray optical scheme resolution and the pixel size of the 2D detector as well.…”

Section: Methodsmentioning

confidence: 99%

In situ X-ray diffraction studies of deformation behavior of ferroelectric triglycine sulfate under uniaxial compression

Akkuratov¹,

Kulikov²,

Pisarevsky³

et al. 2023

J Appl Cryst

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A combination of high-resolution X-ray diffraction and X-ray diffraction topography was used for analysis and visualization of elastic strain in ferroelectric triglycine sulfate (TGS) single crystals under uniaxial compression. Diffraction peaks and topographs were obtained for both the 400 and 060 reflections of TGS in transmission geometry under gradually increased compression stress up to 3.5 MPa applied along the [100] and [010] crystallographic directions. All the diffraction data from the sample were obtained from the whole crystal volume with wide beam illumination. Analysis of diffraction patterns revealed a nonlinear increase in integral intensity versus stress and a linear increase in peak broadening versus stress for all compression measurement combinations. The topographs confirmed that the formation of uniform and non-uniform strain fields depended on the direction of crystal compression and its relationship with integral intensity. A twinning process was found for the in-plane reflection along the [100] direction. All the effects induced by compression were reversible after decompression of the sample. According to the results, a significant anisotropy of deformation processes depending on the crystallographic direction was observed, which can be explained by the proposed deformation mechanism with superposition of compression stress, the piezoelectric effect and ferroelectric domain evolution.

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“…While g × b = 0 is sufficient to render screw dislocations invisible, both g × b = 0 and g × (b × l) = 0 are required criteria for edge dislocations, and mixed dislocations are never completely invisible. 23 This also implies that topographic images for several noncollinear reflections hkl are required to detect all possible dislocation types.…”

Section: ■ Introductionmentioning

confidence: 99%

Dislocation Climb in AlN Crystals Grown at Low-Temperature Gradients Revealed by 3D X-ray Diffraction Imaging

Straubinger

Hartmann

Kabukcuoglu

et al. 2023

Crystal Growth & Design

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The dislocation evolution in a cross-section a-plane cut through a sublimation-grown aluminum nitride (AlN) crystal grown with low-temperature gradients and subsequent low thermal stress is investigated with different X-ray diffraction imaging methods. Exploiting the so-called weak-beam contrast using monochromatic X-rays in combination with suitable three-dimensional (3D) interpretation and reconstruction allows the identification of individual dislocations as well as tracing their progression in the crystal volume, even in the considerably strained interface region. It is particularly striking that the laterally grown crystal volume is dislocation-free. The dislocation densities in the seed and the bulk volume are similar (1 × 103 cm–2), but while the dislocations in the seed are randomly arranged, the dislocations in the bulk volume show a uniform line shape, indicating a common mechanism of dislocation movement. Since the dislocation slings in the bulk do not lie in slip planes, it can be concluded that the lateral movement does not result from dislocation glide, but from impurity-driven climb of dislocations during growth. The absence of slip can be explained by the low-temperature gradients and the subsequent low thermal stress below the critical resolved shear stress (CRSS).

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X-Ray Diffraction Topography Methods (Review)

Cited by 16 publications

References 176 publications

Section methods of X-Ray diffraction topography

Section methods of X-Ray diffraction topography

In situ X-ray diffraction studies of deformation behavior of ferroelectric triglycine sulfate under uniaxial compression

Dislocation Climb in AlN Crystals Grown at Low-Temperature Gradients Revealed by 3D X-ray Diffraction Imaging

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