X‐ray fluorescence analysis at the naval research laboratory

Gilfrich, John

doi:10.1002/xrs.483

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Fundamental Parameter Method inX‐Ray Fluorescence Analysis

Kawai

Yamasaki

Tanaka

2019

Encyclopedia of Analytical Chemistry

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The fundamental parameter (FP) method for X‐ray fluorescence (XRF) analysis is explained using 18‐8 steel spectrum as an example. The accuracy and precision are discussed. Other related alpha parameter method and d j method are compared. The FP method is a first‐principles calculation method of chemical element concentration from the measured XRF spectra using the FPs such as the X‐ray absorption coefficients, fluorescence yields, jump ratios, branching ratios, and the incident spectrum from the X‐ray tube. Based only on these physics parameters and the measured spectra, concentrations in the specimen can be obtained accurately in spite that the XRF spectra are heavily affected by the matrix effects, such as absorption and enhancement effects. The problems and future directions to the improvement of present FP method are also discussed.

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