1991
DOI: 10.1063/1.460886
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X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers

Abstract: X-ray reflection (both specular and off-specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers (n-C18H37SiO1.5) formed by self-assembly from solution on silicon wafers. GID studies of complete monolayers reveal a single ring of scattering associated with the monolayer. The Lorentzian line shape of this ring indicates that the film is characterized by liquidlike order, with a typical translational correlation length of about 45 Å. The thermal coeffici… Show more

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Cited by 136 publications
(128 citation statements)
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“…2 Inset). These values are in very good agreement with the work of Tidswell et al (19,20), showing that the OTS layer is homogenous.…”
supporting
confidence: 82%
“…2 Inset). These values are in very good agreement with the work of Tidswell et al (19,20), showing that the OTS layer is homogenous.…”
supporting
confidence: 82%
“…The presence of too much water causes polymerization of OTS molecules and hence leads to poor quality of monolayers. 5 Since silica is hydrophilic a thin layer of water exists on its surface, which helps physisorption of the OTS molecule. At this stage OTS molecules are mobile.…”
Section: Introductionmentioning
confidence: 99%
“…Under submonolayer conditions the surface is often described as either being uniformly covered with an expanded monolayer of decreased height or intermittently covered with condensed "islands" of monolayer (2)(3)(4)(5)(6). Thus a microheterogeneous surface of mixed surface chemistry can be created.…”
Section: Introductionmentioning
confidence: 99%