X-ray imaging of an industrial microcontroller sample using dual-energy technique

Abstract

In a conventional single-energy X-ray imaging technique, the information obtained from the examined object are often not sufficient for precise characterization. Hence, this study was designed to assess whether the dual-energy imaging technique would be a good alternative to the conventional method and can be used to improve the output image. An electronic microcontroller was chosen as the sample due to its complex inner structure. It was scanned using the X-ray micro computed tomography (micro-CT) scanner at two different energy levels: 60kVp and 100kVp. Dual-energy image processing method was applied to the acquired image and the results were compared to the single-energy image in term of contrast and image quality. The combined information from dual-energy scan at 60kVp and 100kVp was able to visualize the sample’s internal structure (raised surface). By comparison, the single-energy imaging technique was only capable at producing shadow image. The resolution of the dual-energy image, however, was much lower due to the loss of data….