2010
DOI: 10.1088/0953-4075/43/19/194008
|View full text |Cite
|
Sign up to set email alerts
|

X-ray laser spectroscopy of highly charged ions at FLASH

Abstract: Abstract. Laser spectroscopy, widely applied in physics and chemistry, is extended into the soft x-ray region for the first time. Resonant fluorescence excitation of highly charged ions (HCI) by soft x-ray free-electron lasers shows here the potential for unprecedented precision on photonic transitions hitherto out of reach. The novel experiments combine an electron beam ion trap (EBIT) with the Free-electron LASer at Hamburg (FLASH) to measure resonant fluorescence by trapped HCI as a function of the waveleng… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
44
0
1

Year Published

2011
2011
2024
2024

Publication Types

Select...
6
2
2

Relationship

1
9

Authors

Journals

citations
Cited by 48 publications
(45 citation statements)
references
References 98 publications
(146 reference statements)
0
44
0
1
Order By: Relevance
“…For this reason experiments have been performed on many different high-Z ionic species such as U 91+ [11]. However, the required (very) short wavelengths for excitation, such as hard x-rays, makes it very difficult to perform absolute frequency measurements (see e.g., [26] and references therein).…”
Section: Introductionmentioning
confidence: 99%
“…For this reason experiments have been performed on many different high-Z ionic species such as U 91+ [11]. However, the required (very) short wavelengths for excitation, such as hard x-rays, makes it very difficult to perform absolute frequency measurements (see e.g., [26] and references therein).…”
Section: Introductionmentioning
confidence: 99%
“…Together with a measurement of the relative oscillator strength of the fluorescence, this allows us to obtain absolute values for the decay rates. We employ the now wellestablished combination of the transportable FLASH-EBIT with an intense x-ray source [25,[27][28][29][30][31] and monitor the charge-state distribution to detect photoionization.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…In the vacuum ultraviolet (VUV), extreme ultraviolet (EUV), or X-ray range, however, there now are tunable light sources that can fill this role. The Heidelberg device FLASH-EBIT has been transported to the synchrotron light sources PETRA (at DESY Hamburg) [37] and BESSY-II (Berlin) [38], and to the free-electron lasers FLASH (at DESY Hamburg) [39,40] and LCLS (at SLAC, Menlo Park, CA) [41]. The electron beam ion trap was used to provide a target of highly charged ions of a known element and predictable highest charge state, and the narrowband VUV/EUV/X-ray radiation was scanned across a spectral band, resulting in detectable fluorescence only when in resonance with atomic transitions (usually ground state transitions) in the target.…”
Section: Active Interrogationmentioning
confidence: 99%