2013
DOI: 10.1038/ncomms3774
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X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation

Abstract: Understanding and controlling the behaviour of dislocations is crucial for a wide range of applications, from nano-electronics and solar cells to structural engineering alloys. Quantitative X-ray diffraction measurements of the strain fields due to individual dislocations, particularly in the bulk, however, have thus far remained elusive. Here we report the first characterization of a single dislocation in a freestanding GaAs/In 0.2 Ga 0.8 As/GaAs membrane by synchrotron X-ray micro-beam Laue diffraction. Our … Show more

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Cited by 52 publications
(44 citation statements)
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“…The effective thickness in nanomaterials is limited by the specimen size. As illustrated experimentally by Hofmann et al [27], a single dislocation line within a nanostructure induces a sharp change of the lattice rotation similar to a tilt boundary in a bulk specimen (see Fig. 6(a) and (b)).…”
Section: Number Of Stored Gndssupporting
confidence: 53%
“…The effective thickness in nanomaterials is limited by the specimen size. As illustrated experimentally by Hofmann et al [27], a single dislocation line within a nanostructure induces a sharp change of the lattice rotation similar to a tilt boundary in a bulk specimen (see Fig. 6(a) and (b)).…”
Section: Number Of Stored Gndssupporting
confidence: 53%
“…In particular the symmetry of the deformation fields is reproduced. Experimental data for the ɛxz and ɛyz components is noisy as the experimental configuration is relatively insensitive to these strain components (Hofmann et al, 2013). (Kartal et al, 2015) used HR-EBSD, on the free surface of a nickel sample, to extract the full residual elastic strain tensor resulting from differences in thermal expansivities between the nickel matrix and a carbide particle embedded within it.…”
Section: Residual Elastic Lattice Strains and Rotationsmentioning
confidence: 99%
“…of Laue measurements 38,51 and high spatial resolution of HR-EBSD measurements 44,52 detect the far-field and near-field deformation respectively. In the unimplanted sample, a small zone of high GND density is seen close to the indent (Figure 6 (d…”
Section: Gnd Densitymentioning
confidence: 99%