X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals

Abstract

X‐ray multiple diffraction experiments with synchrotron radiation were carried out on pure and doped nonlinear optical crystals: NH4H2PO4 and KH2PO4 doped with Ni and Mn, respectively. Variations in the intensity profiles were observed from pure to doped samples, and these variations correlated with shifts in the structure factor phases, also known as triplet phases. This result demonstrates the potential of X‐ray phase measurements to study doping in this type of single crystal. Different methodologies for probing structural changes were developed. Dynamical diffraction simulations and curve fitting procedures were also necessary for accurate phase determination. Structural changes causing the observed phase shifts are discussed.

Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators

“…X-ray diffraction data were acquired at the XRD2 beamline of the Brazilian Synchrotron Light Laboratory (LNLS) [9][10][11]. The photon energy was tuned to 8 keV (λ = 1.54009 Å exactly) by using a double-crystal (111) Si monochromator; logitudinal coherence length of ~0.6 m.…”

Simulation of X-ray diffraction in Mn$_x$Bi$_2$Te$_{3+x}$ epitaxic films

“…1 This set of recursive equations that become very suitable for layered materials has emerged within a vast effort to advance X-ray diffraction methods for analyzing relevant materials, ranging from nanostructured devices to biological tissues. [5][6][7][8][9][10][11][12]…”

Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals

“…stands for each linearly polarized component of the incident wavefield vibrating along direction ε = cos(ε) π + sin(ε) σ. 5,[10][11][12] The two orthogonal components have been defined as π = σ× ŝ and σ = ŝ× ŝ / sin(2θ). By using ŝ = ẑ and ŝ = sin(2θ) x+cos(2θ) ẑ, we have that…”