X-Ray Photoelectron Diffraction. Possibilities of Surface Structural Analysis

Шалаева, Е. В.; Kuznetsov, M. V.

doi:10.1023/b:jory.0000009675.42838.de

Cited by 9 publications

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“…Owing to these high energies of electrons, the forward scattering contribu tion dominates. Thus, the effect of the type of emitted electron (s, p, d, or f) on XPD can be neglected; i.e., the so called s approximation provides a high accu racy [3]. Strictly speaking, XPD means X ray photo electron diffraction, but this abbreviation is used in this work also for the X ray stimulated emission of Auger electrons from Se(LMM).…”

Section: Atomic Structure Of a 1t Tise 2 Surface Layer From Photoelecmentioning

confidence: 99%

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Atomic structure of a 1T-TiSe2 surface layer from photoelectron and Auger electron holography data

et al. 2012

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Section: Atomic Structure Of a 1t Tise 2 Surface Layer From Photoelecmentioning

confidence: 99%

“…X ray photoelectron diffraction (XPD) attracts attention as an efficient method for studying the struc ture of the surface layers of solids [1][2][3]. An interesting field of XPD is photoelectron holography, where experimental 2π diffraction patterns of emitted photo electrons are considered as holographic diagrams.…”

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Atomic structure of a 1T-TiSe2 surface layer from photoelectron and Auger electron holography data

et al. 2012

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“…Following the usual definition, hereafter XPD refers to photoelectron diffraction in angle-scanned mode (Granozzi & Sambi, 1996;Shalaeva & Kuznetsov, 2003). In the three-step photoemission model (Hü fner, 2003), when an X-ray photon strikes a material with sufficient energy, by absorption of the energy of the X-ray photon a tightly bound core electron can be excited to an energy well above the Fermi level.…”

Section: Introductionmentioning

confidence: 99%

“…When photoelectrons travel through the material, they may be elastically scattered by the Coulomb potential of neighboring atoms. The scattered electron wave and unscattered electron waves can constructively and destructively interfere with each other and create a pattern which carries information about the structure around the emitting atoms (Barton, 1988;Shalaeva & Kuznetsov, 2003; Suga & Sekiyama, ). By scanning the photoelectron intensity distribution as a function of emission angles over the whole hemisphere above a surface, a diffraction pattern or diffractogram can be recorded.…”

Section: Introductionmentioning

confidence: 99%

Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro

et al. 2018

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A software package is presented for nearly real‐time display of diffractograms during X‐ray photoelectron diffraction (XPD) data acquisition and for processing and analysis after an experiment. During the experiment, the package is able to automatically read X‐ray photoelectron spectroscopy (XPS) data, perform initial data processing and project intensity values as XPD diffractograms. Four display modes are supported. After the experiment, the package is able to open, process and analyze XPD patterns. The processing functions include rotation, cropping, creating a full 2π pattern using symmetry operations, smoothing and converting a pattern to an image suitable for publication. The analysis functions include displaying polar angles, azimuthal angles, intensity, the core level spectrum at a selected angular data point, and azimuthal and radial profiles. The package also integrates fitting functions for core level spectra. The package is developed using the IGOR Pro scripting language. A graphical user interface has been developed to allow all the operations just by mouse clicking. The package is designed to interface directly with an XPD system at the Saclay center of the French Atomic Energy and Alternative Energies Authority, but the algorithms are generally applicable and can be readily adapted to other XPD systems.

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“…O padrão obtido é característico da amostra do material e pode ser identificado por comparação com padrões de uma base de dados116 .Os catalisadores de Ni-CeO 2 -ZrO 2 -Al 2 O 3 foram submetidos a técnica de difração de fotoelétrons (XPD). Esta técnica tem sido utilizada para a caracterização estrutural de filmes finos e superfícies de semi condutores, metais e óxidos[118][119][120][121][122] . Dependendo do sistema estudado, o XPD pode fornecer informações sobre arranjos atômicos na superfície, direção das ligações moleculares, simetria e distancia das ligações.Para as análises de RTP-H 2 utilizou-se um equipamento Sistema AnalíticoMultipropósito (SAMP3), com um detector de condutividade térmica.…”

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Desenvolvimento e caracterização de catalisadores de níquel suportados em matrizes CeO2-ZrO2-Al2O3, CeO2-La2O3-Al2O3 e ZrO2-La2O3-Al2O3 avaliados para as reações de reforma do metano

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Senhor Jesus, muito obrigada! Pelo ar que nos dás, pelo pão que nos deste, pela roupa que nos veste, pela alegria que possuímos, por tudo de que nos nutrimos Muito obrigada, pela beleza da paisagem, pelas aves que voam no céu de anil, pelas Tuas dádivas mil! Muito obrigada, Senhor! Pelos olhos que temos... Olhos que vêem o céu, que vêem a terra e o mar, que contemplam toda beleza! Olhos que iluminam de amor ante o majestoso festival de cor da generosa Natureza! E os que perderam a visão? Deixa-me rogar por eles Ao Teu nobre coração! Eu sei que depois desta vida, Além da morte, voltarão a ver com alegria incontida... Agradecimentos À Deus, pela minha vida. À minha família que é a base de tudo o que sou hoje, pela confiança depositada, por sempre me incentivarem, me ampararem e por me ajudarem chegar aonde cheguei. À Profa. Elisabete Moreira Assaf, pela orientação no desenvolvimento deste trabalho, pela confiança, pela dedicação, pela paciência e pela competência com que orientou esse trabalho.

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X-Ray Photoelectron Diffraction. Possibilities of Surface Structural Analysis

Cited by 9 publications

References 176 publications

Atomic structure of a 1T-TiSe2 surface layer from photoelectron and Auger electron holography data

Atomic structure of a 1T-TiSe2 surface layer from photoelectron and Auger electron holography data

Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro

Desenvolvimento e caracterização de catalisadores de níquel suportados em matrizes CeO2-ZrO2-Al2O3, CeO2-La2O3-Al2O3 e ZrO2-La2O3-Al2O3 avaliados para as reações de reforma do metano

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