X-ray Photoelectron Spectroscopic Analysis of Pt Nanoparticles on Highly Oriented Pyrolytic Graphite, Using Symmetric Component Line Shapes

Abstract

The X-ray photoelectron spectroscopic characterizations of Pt nanoparticles evaporated onto untreated and Ar+-treated highly oriented pyrolytic graphite surfaces, with, respectively, low and high surface defect densities have been studied using multicomponent analysis with symmetric line shapes: each Pt4f spectral component (f7/2 and f5/2) was deconvoluted into three symmetric peaks. On analyzing the relationships among the Pt4f, C1s, and O1s spectra, we attribute these peaks to the existence of surface oxidation on the platinum nanoparticles and to the different electronic configurations of surface and bulk Pt atoms. We use the varying intensities of these component peaks, as a function of deposited Pt, to explain the changing shape of the Pt4f asymmetric envelope with nanoparticle size.

X-ray photoelectron spectroscopic and morphologic studies of Ru nanoparticles deposited onto highly oriented pyrolytic graphite

“…Figure 1b is obtained by fitting the known C1s peak positions [13], followed by the deconvolution of the Ru3d 5/2 ,3d 3/2 M a n u s c r i p t 7 doublet, using the expected 3:2 spin-orbit peak area ratio and a constant 3d 5/2 -3d 3/2 peak component energy separation. We found, as mentioned earlier, that three Ru components were required, as in our studies of Pt [14] and Pd [15]. Their attributions are discussed below.…”

“…Thus, our use of additional symmetric peaks to account for the asymmetry reveals the presence of component peaks that are otherwise hidden when using asymmetric components; as expected, these component peaks have energies independent of experimental conditions. As noted in our Invited Feature Article on the subject [12], these previously hidden component peaks give information on NP surface contamination, oxidation, electronic configuration, and interfacial bonding; in every case [11][12][13][14][15][16], this information has been confirmed from other sources.…”

“…We have employed the symmetric peak XPS component analysis method, developed in our laboratory, to identify the surface, volume, electronic and contaminant features of several First, Second and Third Transition Series metal NPs [11][12][13][14][15][16], showing its validity in the characterization of metal NP surface chemistry and structure.…”

Analysis of Electrochemical Reactions of Natural Graphite Electrode in Chloroaluminate Type Room-temperature Ionic Liquid Electrolyte Containing Lithium Ion

“…7(iii) および (iv) の PAA バインダー NG-3 電極 の高分解能 XPS スペクトルより，(a) 電解質に浸漬前には PAA の -COOH (533.9 eV) および -OH (532.6 eV) 23 …”

Single-Crystal Bismuth Iodide Gamma-Ray Spectrometers

“…85 Since Pt was reported to have different electronic configurations for surface and bulk atoms, 86 the asymmetric peak was explained due to the surface Pt atoms in the 5d 9 6s 1 configuration, bulk Pt atoms in the 5d 8 6s 2 configuration, and surface Pt absorbed oxygen. 85 The peak properties and their assignments are summarized in Table 11. …”