1999
DOI: 10.1063/1.371564
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X-ray photoelectron spectroscopy analysis of GaN/(0001)AlN and AlN/(0001)GaN growth mechanisms

Abstract: The mechanisms of growth of GaN on AlN and AlN on GaN via gas source-molecular beam epitaxy with NH3 as the nitrogen source have been investigated using x-ray photoelectron spectroscopy, low energy electron diffraction, and Auger electron spectroscopy. The growth of GaN on AlN at low temperatures (650–750 °C) occurs via a Stranski–Krastanov 2D→3D type mechanism with the transition to 3D growth occurring at ≈10–15 Å. The mechanism changes to Frank van der Merwe (FM)/layer-by-layer growth above 800 °C. The growt… Show more

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Cited by 36 publications
(24 citation statements)
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“…3(b) is centered at 397.6 eV, instead of 399 eV (binding energy of N element existing as atomic style), similar to the results of Li (397.4 eV) [20] and Veal (397.6 eV) [21], i.e., the N atom exists as a nitride. The width and slight asymmetry of the N1s peak are attributed to N-H 2 and N-H 3 formation due to the interaction between N 2 and NH 3 at the GaN film surface [22]. As seen in Fig.…”
Section: Microstructure and Components Analysismentioning
confidence: 80%
“…3(b) is centered at 397.6 eV, instead of 399 eV (binding energy of N element existing as atomic style), similar to the results of Li (397.4 eV) [20] and Veal (397.6 eV) [21], i.e., the N atom exists as a nitride. The width and slight asymmetry of the N1s peak are attributed to N-H 2 and N-H 3 formation due to the interaction between N 2 and NH 3 at the GaN film surface [22]. As seen in Fig.…”
Section: Microstructure and Components Analysismentioning
confidence: 80%
“…4(d) is centered at 397.6 eV, instead of 399 eV (binding energy of N element existing as atomic style), similar to the results of Li (397.4 eV) [23] and Veal (397.6 eV) [21], that is, the N atom exists as a nitride. The width and slight asymmetry of the N1s peak are attributed to N-H 2 and N-H 3 formation due to the interaction between N 2 and NH 3 at the GaN film surface [24]. The O1s peak is centered at 530.7 eV.…”
Section: Resultsmentioning
confidence: 96%
“…4(b) is centered at 397.6 eV, instead of 399 eV (binding energy of N element existing as atomic style), similar to the results of Li (397.4 eV) [16] and Veal (397.6 eV) [17], that is, the N atom exists as a nitride. The width and slight asymmetry of the N1s peak are attributed to N-H 2 and N-H 3 formation due to the interaction between N 2 and NH 3 at the GaN film [18] surface.…”
Section: Microstructure and Components Analysismentioning
confidence: 99%