X-ray photoelectron spectroscopy for detection of the different Si–O bonding states of silicon

Abstract

X-ray photoelectron spectroscopy (XPS) was used to detect the bonding between a silica particle surface and attached silanes. In addition to the commonly recorded Si 2p spectrum, the Si 1 s level is also accessible when monochromatic Ag Lalpha X-rays are applied. Furthermore, the spectrum of the Si 1 s level shows a fine structure. After spectrum deconvolution, we assigned the fitted spectral peaks to Si-C bonds of the silanes and to the Si-O bonds of the silica network. The recorded Si 1 s spectra were deconvoluted into peaks originating from Si-C bonds and the Si-O-Si silica network. To check the results of spectrum deconvolution, several differently functionalized silanes containing stoichiometric amounts of heteroatoms were applied for silica surface modification. We conclude that spectra deconvolution of the Si 1 s signal is an appropriate means for quantification of surface attached silane molecules.

Grafting of poly(methyl vinyl ketone) onto aluminum surface

“…8). Such a peak appearance can be attributed to the adsorption of organosi- [17]. The presence of Me-OSi-R structures in the polymer-grafted surfaces (Al-A PMVK and Al-V PMVK) strongly indicates that the siloxane layer is preserved during polymer grafting.…”

XPS and FT-IR investigation of silicate polymers

“…The energy difference between the Si 2p 3/2 and Si 2p 1/2 levels is *0.5 eV, causing the two peaks to overlap [19]. Fig.…”

“…Fig. 4 FT-IR spectra of the inorganic polymer recorded after 3 weeks compared to a spectra recorded after 1 year peak intensities has been determined experimentally to 0.52 in a high-resolution XPS investigation of the metallic component of a clean silicon wafer compared to a theoretical ratio of 0.5 [19]. Comparison of the metallic and oxidized silicon species has shown that the Si-O-Si composite peak is broadened and does not show a resolved structure.…”

“…105.2 eV, while Si-O-Si bonds were found at 103.8 eV [20,21]. Conventional XPS studies are not suitable to determine the presence of those surface groups [19,20].…”

Silicate Covering Layer on Pyrite Surface in the Presence of Silicon–Catechol Complex for Acid Mine Drainage Prevention

“…The energy difference between the Si 2p 3/2 and Si 2p 1/2 levels is ³0.5 eV causing the two peaks to overlap. 40) The Si 2p spectra of pyrite samples are illustrated in Fig. 8.…”