2017
DOI: 10.1016/j.tsf.2017.07.006
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X-ray photoelectron spectroscopy studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N2+ ions: Substrate temperature induced compositional variations

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Cited by 28 publications
(12 citation statements)
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References 23 publications
(32 reference statements)
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“…No magnetic signals were observed in the measurements performed on the bare sample holder and 7 samples. Signatures of magnetic impurities could not be detected in X-ray photoemission spectroscopy measurements performed on the AlN thin films up to a depth of 50 nm [31].…”
Section: Resultsmentioning
confidence: 87%
“…No magnetic signals were observed in the measurements performed on the bare sample holder and 7 samples. Signatures of magnetic impurities could not be detected in X-ray photoemission spectroscopy measurements performed on the AlN thin films up to a depth of 50 nm [31].…”
Section: Resultsmentioning
confidence: 87%
“…However, the change in the nitrogen content is considered to be not significant. As shown by Sharma et al by means of XPS, a small change in the substrate temperature from room temperature to 100 °C does not lead to a change in the chemical shifts [39]. However, a higher change of the substrate temperature from room temperature to 500 °C alters the chemical shift of the N-1s bonding [39].…”
Section: Resultsmentioning
confidence: 99%
“…As shown by Sharma et al by means of XPS, a small change in the substrate temperature from room temperature to 100 °C does not lead to a change in the chemical shifts [39]. However, a higher change of the substrate temperature from room temperature to 500 °C alters the chemical shift of the N-1s bonding [39]. The highest nitrogen content of 57.9 ± 0.3 at.-% is measured for the AlN-3 thin film, which is caused by the higher nitrogen content to noble gas ratio in the deposition chamber due to the used gas flow rates.…”
Section: Resultsmentioning
confidence: 99%
“…The present results satisfied the binding energies values with the previous existing XPS data of gallium oxide deposition analysis. [27][28][29]…”
Section: Resultsmentioning
confidence: 99%