Ga 2 Se 3 films were deposited by the thermal evaporation of the bulk material onto pyrographite substrates under vacuum. The I-V characteristic curves were found to be typical for a memory switch. They exhibited a transition from an ohmic region in the lower-field region to a non-ohmic region in the highfield region in the preswitching region, which has been explained by the Poole-Frenkel effect. The temperature dependence of the resistance in the ohmic region was found to be that of a thermally activated process. It was also found that the mean value of the switching voltage increased linearly with increasing film thickness in the range from 291 nm to 516 nm, while it decreased exponentially with increasing temperature in the range from 298 K to 393 K. The results were explained in accordance with the electrothermal model for the switching process.