2003
DOI: 10.1016/s0921-4526(03)00285-0
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X-ray scattering investigation of surfactant-assisted growth in Co/Cu multilayers

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Cited by 14 publications
(5 citation statements)
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“…There are few reports on the effect of the interface roughness and the roughness correlation between interfaces on the properties of junction. It is known that the ability to directly measure the topological relationship between buried layers is critical for improving the performance of magnetic junction [11][12][13][14]. The present study deals with Fe/MgO/Fe 3 O 4 junction structures.…”
Section: Introductionmentioning
confidence: 99%
“…There are few reports on the effect of the interface roughness and the roughness correlation between interfaces on the properties of junction. It is known that the ability to directly measure the topological relationship between buried layers is critical for improving the performance of magnetic junction [11][12][13][14]. The present study deals with Fe/MgO/Fe 3 O 4 junction structures.…”
Section: Introductionmentioning
confidence: 99%
“…Studies of surfactant influence on thin film and multilayer growth, and of correlation between structure and magnetotransport properties for these systems, have been performed previously, in particular for indium and lead [7][8][9][10][11]. However, there is not much evidence about the role of bismuth in altering, modifying, or controlling interfaces and film morphology.…”
Section: Discussionmentioning
confidence: 99%
“…Our analysis suggests a transfer of magnetization from phase 3 to phase 1 (and, to a lesser extent, to phase 2) when the temperature is increased from 2 K up to about 100 K, which indicates that phase 3 is somewhat interacting with the two Co layers. The effect can be explained as follows: phase 3 is constituted by small ferromagnetic particles (or clusters) which are generated during deposition of both the Sn islandlike spacer on the Co underlayer and the Co cap layer on top of Sn islands, for reasons connected to the minimization of the surface energy of Sn which may show a surfactant behaviour as In, Ag and Pb show [10]. These Co particles are therefore embedded in the grown Sn islands at a short distance from both Co layers, considering the thicknesses of the evaporated materials.…”
Section: Analysis Of Magnetization Measurementsmentioning
confidence: 99%