2002
DOI: 10.1021/ac020241k
|View full text |Cite
|
Sign up to set email alerts
|

X-ray Spectrometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

2003
2003
2021
2021

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 116 publications
0
3
0
Order By: Relevance
“…1c). As the method for preparing samples for LA-ICP-MS resulted in IVD loss, a scanning confocal SR-μXRF was used to examine the distribution of tungsten in IVDs [since this non-destructive technique is a powerful analytical tool for qualitative analysis of the chemical elements present in the sample (Szalóki et al, 2004;VanderSchee et al, 2018)]. Recently, SR-μXRF has been used to determine the spatial distribution and speciation of tungsten in bone (VanderSchee et al, 2018).…”
Section: Resultsmentioning
confidence: 99%
“…1c). As the method for preparing samples for LA-ICP-MS resulted in IVD loss, a scanning confocal SR-μXRF was used to examine the distribution of tungsten in IVDs [since this non-destructive technique is a powerful analytical tool for qualitative analysis of the chemical elements present in the sample (Szalóki et al, 2004;VanderSchee et al, 2018)]. Recently, SR-μXRF has been used to determine the spatial distribution and speciation of tungsten in bone (VanderSchee et al, 2018).…”
Section: Resultsmentioning
confidence: 99%
“…The relation between the modulated part χ(k) of an absorption spectrum and the structural parameters of the sample, has been established in numerous theoretical works [135,136] and can be written as:…”
Section: Extended X-ray Absorption Fine Structure (Exafs)mentioning
confidence: 99%
“…However, it is appropriate to start this year's ASU review by marking the passing during June, 2002, of one of the great communicators of modern XRF, Ron Jenkins, whose work must have touched all that contribute to this topic. 1 The Analytical Chemistry review of X-ray spectrometry was published during the current review period by Szaloki et al 265 Although there is some topic overlap with the present review, the Analytical Chemistry review extends to subjects such as EPMA, PIXE and XAS. Other XRF topic reviews included one by Munk 2 on sub-ppm levels of trace elements in Trends in Analytical Chemistry and the preparation and use of reference materials for quality assurance in inorganic trace analysis, 3 which covered the preparation and role of natural matrix reference materials of biological origin whose suitability extends to microanalytical techniques.…”
mentioning
confidence: 91%