1973
DOI: 10.1021/ac60334a033
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X-ray spectrometry for particulate air pollution. Quantitative comparison of techniques

Abstract: X-Ray fluorescence spectrometry is well suited to the determination of elemental composition of air pollution particulate samples because no sample preparation is required for filter collections, 1 00-second detection limits are 1 to 100 ng/cmz for most elements of interest, the technique is nondestructive, and 10 or 20 elements can be measured simultaneously using presently available commercial equipment. The best detection limits are achieved by reducing the background primary radiation scattered into the me… Show more

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Cited by 75 publications
(18 citation statements)
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“…However, to obtain similar results, the energydispersive system must operate for about ten times as long as the wavelength-dispersive system. These results are in agreement with the conclusions reached by (lilfrich et al [2] who made similar comparisons of equipment for the analysis of air pollution samples, and with the conclusions of Leyden…”
Section: Sincesupporting
confidence: 92%
See 1 more Smart Citation
“…However, to obtain similar results, the energydispersive system must operate for about ten times as long as the wavelength-dispersive system. These results are in agreement with the conclusions reached by (lilfrich et al [2] who made similar comparisons of equipment for the analysis of air pollution samples, and with the conclusions of Leyden…”
Section: Sincesupporting
confidence: 92%
“…Since the energy-dispersive system collects information on the whole x-ray spectrum, only a small portion of the signal is within the peak of interest while the wavel ength-dispers ive system collects information on only the peak of interest [2]. Therefore, with the energydispersive system, counts must be accumulated for a longer period of time than with the wave length-dispers ive system.…”
Section: Measurements and Resultsmentioning
confidence: 99%
“…Several authors have compared the benefits of SEM-EDX and XRF (Russ 1971;Gilfrich et al 1973;Bertin 1975;Jenkins 1976;Whiston 1987;Jenkins 1988). Several authors have compared the benefits of SEM-EDX and XRF (Russ 1971;Gilfrich et al 1973;Bertin 1975;Jenkins 1976;Whiston 1987;Jenkins 1988).…”
Section: Application Of Edx To Photographic Conservationmentioning
confidence: 99%
“…5 The sample is collected on an appropriate filter, X-ray fluorescence is induced by X-rays, 6 protons, 7 or other charged particles, 8 and the measured fluorescent intensity is used to determine the amount of that element present.…”
Section: X-ray Fluorescencementioning
confidence: 99%