1969
DOI: 10.1002/app.1969.070131119
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X‐ray studies on cellophane1

Abstract: SynopsisX-Ray diffractograms of cellophane showed a considerable variation in the intensity corresponding to the 101, 107, and 002 planes. Application of generally accepted procedures for estimating crystalline content in cellulosic materials yields varying results for crystallinity in cellophane. It is concluded that such procedures are not applicable to cellophane used in this study. EXPERIMENTALThe present work on cellophane was carried out in connection with an investigation of the dielectric properties of… Show more

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Cited by 4 publications
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