2007
DOI: 10.1016/j.surfcoat.2006.10.001
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X-ray study of tin oxide films obtained by reactive DC sputtering from a metallic tin target in pure oxygen plasma

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Cited by 13 publications
(4 citation statements)
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“…Moreover, the sputtered material would also react in the substrate. Upon its heating structural and chemical changes may be induced, depending on the growth conditions [16]. Taken the aforementioned into consideration, the approach proposed by Noguera et al seems to be more consistent with our conditions.…”
Section: Structural Analysis Of Tellurite Glassessupporting
confidence: 87%
See 1 more Smart Citation
“…Moreover, the sputtered material would also react in the substrate. Upon its heating structural and chemical changes may be induced, depending on the growth conditions [16]. Taken the aforementioned into consideration, the approach proposed by Noguera et al seems to be more consistent with our conditions.…”
Section: Structural Analysis Of Tellurite Glassessupporting
confidence: 87%
“…In the case of sputter deposited CdTeO films, it is proposed that at high N 2 O pressures the oxidant dissociates mainly in the target [14,15] thus forming an oxide layer, frequently named in the literature as target-poisoning [16]. The nature and stoichiometry of the compound that would be sputtered from the target is unknown, but following Miotto et al could be speculated that as Cd-O and Te-O bonds are formed upon oxygen absorption in detriment of CdTe bonds, the sputtered species will be closely TeO 2 and CdO [6] which relative amounts may vary depending on the plasma power.…”
Section: Structural Analysis Of Tellurite Glassesmentioning
confidence: 99%
“…The discharge voltage was not manually adjusted but shows a slight rise by 10% or so, automatically following the increase of the sputtering current. The similar phenomenon was also observed in a recent work on tin oxide films preparation by reactive dc sputtering by Martel et al [13]. The sputtering power varies from 33.3 to 82.6 W and the optimum resistivity of 5.8 Â 10 À4 XÁcm is attained at 71.6 W. Fig.…”
Section: Electrical Propertiessupporting
confidence: 86%
“…It is evident that the size, crystallinity, purity, morphology and surface condition of the particles depend on the processing method and synthesizing parameters. Several procedures including spray pyrolysis [15], pulsed laser deposition [16], chemical vapor deposition [17], gas-phase condensation [14], sputtering [18] and sol-gel [19] have been used for synthesizing tin oxide powders and films. Among various techniques, processing of the material in a dry and clean gaseous environment has the advantage of minimizing the contamination of the particles.…”
Section: Introductionmentioning
confidence: 99%