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KUWABATA, Susumu; TORIMOTO, Tsukasa

doi:10.4139/sfj.59.801

Journal of The Surface Finishing Society of Japan

2008

DOI: 10.4139/sfj.59.801

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Susumu KUWABATA¹,

Tsukasa TORIMOTO²

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Cited by 2 publications

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SEM Observation at High Magnification and EDX Analysis of Insulating Sample by Diluted Ionic Liquid

Ze¹,

Imashuku²,

Ichida³

et al. 2011

Journal of The Surface Science Society of Japan

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A few micro liters of 10 −2 wt.% ionic liquid diluted by ethanol or acetone dropped onto insulating samples made it possible to observe scanning electron microscope (SEM) image at 5000 magnification, which is as clear as Pt-Pd sputtering. SEM-EDX analysis of sulfur is possible when using sulfur-free ionic liquid diluted down to 10 −2 wt.%. Quantitative analysis using the ZAF method is also possible for insulating samples.

show abstract

SEM Observation at High Magnification and EDX Analysis of Insulating Sample by Diluted Ionic Liquid

Ze¹,

Imashuku²,

Ichida³

et al. 2011

Journal of The Surface Science Society of Japan

View full text Add to dashboard Cite

show abstract

Electron Microscopic Techniques for Surface Analysis of Steel Products

Nagoshi¹

2015

ZAKAEP

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Untitled

Cited by 2 publications

References 8 publications

SEM Observation at High Magnification and EDX Analysis of Insulating Sample by Diluted Ionic Liquid

SEM Observation at High Magnification and EDX Analysis of Insulating Sample by Diluted Ionic Liquid

Electron Microscopic Techniques for Surface Analysis of Steel Products

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