2015
DOI: 10.1016/j.jnucmat.2014.10.097
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XPS investigation of impurities containing boron films affected by energetic deuterium implantation and thermal desorption

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Cited by 14 publications
(4 citation statements)
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“…The as-prepared sample C–O shows a major single peak at 192.3 eV, which indicates the presence of boron in the form of a B complex (BCO 2 or BC 2 O bond) . The O 1s spectrum (Figure e) of the sample indicates the presence of three chemical states at 532.3 (major component), 530.8, and 528.4 eV, which correspond to the B–O bond, the Zn–O bond, O 2 – in ZnO, respectively Figure f shows the Zn 2p spin–orbit split at 1022.45 eV (Zn 2p3/2) and 1045.7 eV (Zn 2p1/2) with an energy difference of 23.2 eV, which corresponds to Zn 2+ in ZnO .…”
Section: Resultsmentioning
confidence: 96%
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“…The as-prepared sample C–O shows a major single peak at 192.3 eV, which indicates the presence of boron in the form of a B complex (BCO 2 or BC 2 O bond) . The O 1s spectrum (Figure e) of the sample indicates the presence of three chemical states at 532.3 (major component), 530.8, and 528.4 eV, which correspond to the B–O bond, the Zn–O bond, O 2 – in ZnO, respectively Figure f shows the Zn 2p spin–orbit split at 1022.45 eV (Zn 2p3/2) and 1045.7 eV (Zn 2p1/2) with an energy difference of 23.2 eV, which corresponds to Zn 2+ in ZnO .…”
Section: Resultsmentioning
confidence: 96%
“…The B–O bond can be finely divided into BC 2 O/BCO 2 and B 2 O 3 bonds at 192.0 and 193.3 eV, respectively. The as-prepared sample C–O shows a major single peak at 192.3 eV, which indicates the presence of boron in the form of a B complex (BCO 2 or BC 2 O bond) . The O 1s spectrum (Figure e) of the sample indicates the presence of three chemical states at 532.3 (major component), 530.8, and 528.4 eV, which correspond to the B–O bond, the Zn–O bond, O 2 – in ZnO, respectively …”
Section: Resultsmentioning
confidence: 96%
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“…X 射线光电子能谱(X-ray photoelectron spectroscopy, XPS)是用 X 射线辐射被测样品, 使价电子或内层电 子受激发发生跃迁 [83,84] , 以光电子的动能(E b =hv 光能 量-E k 动能-W 功函数)为横坐标, 相对强度(脉冲/s)为 纵坐标可做出光电子能谱图, 进而推测样品中所含元素 种类及元素价态等信息 [85,86] . XPS 可以用来测量: (1)可 以根据能谱图中特征谱线的位置对元素进行定性分析 (除 H、He 以外).…”
Section: 射线光电子能谱(Xps)unclassified