1998
DOI: 10.1016/s0040-6090(98)00386-1
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XPS structural characterization of hydrogenated amorphous carbon thin films prepared by shielded arc ion plating

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Cited by 119 publications
(55 citation statements)
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“…The peaks at 284.6 eV and 285.4 eV are assigned to the C-C bond in sp 2 and sp 3 configuration. These observations are consistent with those reported elsewhere [21,22]. The sp 2 to sp 3 ratio of ta-C films can be determined from the relative intensities of the curve fitted XPS C 1s spectra.…”
Section: Resultssupporting
confidence: 92%
“…The peaks at 284.6 eV and 285.4 eV are assigned to the C-C bond in sp 2 and sp 3 configuration. These observations are consistent with those reported elsewhere [21,22]. The sp 2 to sp 3 ratio of ta-C films can be determined from the relative intensities of the curve fitted XPS C 1s spectra.…”
Section: Resultssupporting
confidence: 92%
“…24 Other experimental works report the C sp 2 BE between 284.15 and 284.4 eV, the C sp 3 BE between 285.2 and 285.5 eV, whereas their BE separation values range from 0.8 to 1.35 eV. [1][2][3][4][5][6][7]25 The reason for these discrepancies is the semiconducting nature of diamond. The reported values of parameter D for diamond (100% of C sp 3 ) vary from 13.0 to 14.5 eV, depending on the type of facets and sp 2 contaminations.…”
Section: Discussionmentioning
confidence: 99%
“…3. Refer to XPS spectra of graphite and diamond 8) , the bond energy of graphite C1s was 284.1 eV, the shape of the peak was asymmetrical, while the bond energy of diamond C1s was 285.5 eV, the shape of the peak was symmetrical. From the peak of C1s in Fig.…”
Section: Xpsmentioning
confidence: 99%