1999
DOI: 10.1002/(sici)1096-9918(199904)27:4<259::aid-sia560>3.0.co;2-n
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XPS study of polycrystalline and epitaxial FeTaN films deposited by d.c. reactive magnetron sputtering

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Cited by 6 publications
(9 citation statements)
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“…Consistent with the in situ XPS, the post-growth signature of SiO 2 supported thin Ta-oxide only shows peaks corresponding to Ta-oxides (Ta4f 7/2 at y26.2 eV), while no peaks corresponding to Ta-metal (Ta4f 7/2 y22 eV) and -carbide (Ta4f 7/2 y23.3 eV) are found. 43,52,[55][56][57] The post growth C1s signature shows sp 2 -bound carbon (C1s y284.5 eV), in agreement with the SEM observations of grown nanotubes (Fig. 1(a), left).…”
Section: Resultssupporting
confidence: 86%
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“…Consistent with the in situ XPS, the post-growth signature of SiO 2 supported thin Ta-oxide only shows peaks corresponding to Ta-oxides (Ta4f 7/2 at y26.2 eV), while no peaks corresponding to Ta-metal (Ta4f 7/2 y22 eV) and -carbide (Ta4f 7/2 y23.3 eV) are found. 43,52,[55][56][57] The post growth C1s signature shows sp 2 -bound carbon (C1s y284.5 eV), in agreement with the SEM observations of grown nanotubes (Fig. 1(a), left).…”
Section: Resultssupporting
confidence: 86%
“…In their as-deposited state (after air exposure), the films show only peaks corresponding to Ta-oxides (Ta4f 7/2 at 26.2 ¡ 0.2 eV). 43,52,[55][56][57] As expected for very thin Ta films after ambient air exposure, 33,52 oxidation of the entire films is confirmed and no peaks corresponding to Ta-metal (Ta4f 7/2 y22 eV) or Ta-carbide (Ta4f 7/2 y23.3 eV) are found. 43,52,[55][56][57] When heated in vacuum, the thin Ta-oxide on SiO 2 support does not change its chemical state, i.e., it stays oxidised even at 850 uC (Fig.…”
Section: Resultssupporting
confidence: 54%
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“…Additionally, a small Ta suboxide contribution emerges again which might point to structural rearrangement in the Ta oxide film.) We note that we do not observe XPS peak shifts associated with alloying of the Fe and the Ta, 44 as we did for metallic Fe and metallic Ta under similar conditions. 39 This indicates that the reduced Fe and the Ta oxide do not undergo intimate mixing.…”
Section: Resultsmentioning
confidence: 99%
“…52,55 During continued exposure, the graphitic sp 2 component grows significantly in intensity with only minor carbide and sp 3 contributions remaining, implying the growth of CNTs (confirmed by postgrowth SEM analysis, showing a low CNT yield corresponding to our AP-CVD results at similar temperatures). The (alloyed) Ta transforms to Ta-carbide (23.5 eV) 51,56 with some Ta-oxide remaining (Figure 11). The Fe exhibits a small shift to 707.2 eV, which points toward stronger interactions between the now carbidic Ta surface and the Fe.…”
Section: Ppt-cvdmentioning
confidence: 99%