1998
DOI: 10.1143/jjap.37.6229
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Y2O3-Stabilized ZrO2 Thin Films Prepared by Metalorganic Chemical Vapor Deposition

Abstract: Zirconia films stabilized by Y2O3 were deposited by metal-organic chemical vapor techniques onto various crystalline substrates. Y2O3, ZrO2 and mixtures of these two were deposited and characterized. The deposition rate, the film composition and the structure could be systematically varied through the Y(C11H19O2)3, Zr(O·t-C4H9)4 and O2 source gas ratios and the substrate temperature. The Y/Zr ratio could be adjusted by controlling the ratio in Y(C11H19O2)3 to Zr(O·t-C4H9)4 partial pressures. Howeve… Show more

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Cited by 36 publications
(7 citation statements)
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“…2) The theoretical input gas concentration of the source gas was calculated using R[source], which was defined in a previous paper. 8) The composition was measured by X-ray fluorescence spectroscopy (XRF) calibrated using standard samples. The constituent phase was identified by X-ray diffraction (XRD).…”
Section: Introductionmentioning
confidence: 99%
“…2) The theoretical input gas concentration of the source gas was calculated using R[source], which was defined in a previous paper. 8) The composition was measured by X-ray fluorescence spectroscopy (XRF) calibrated using standard samples. The constituent phase was identified by X-ray diffraction (XRD).…”
Section: Introductionmentioning
confidence: 99%
“…The input gas-flow rate and concentration of the Bi source was directly controlled by a mass-flow controller. The theoretical input gas-flow rate of the source was defined as R[source] [23].…”
Section: Discussionmentioning
confidence: 99%
“…The composition of the films was controlled by the input gas flow rate of the Ir source keeping the flow rate fixed for the Sr source. The theoretical input gas flow rate of the Ir source, R[Ir(C 7 H 9 )(C 6 H 8 )], was defined elsewhere [16]. 60-70-nm-thick SrRuO 3 films were also grown on (111)SrTiO 3 substrates by MOCVD.…”
Section: Methodsmentioning
confidence: 99%