2005
DOI: 10.1109/mdt.2005.75
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Yield-Driven, False-Path-Aware Clock Skew Scheduling

Abstract: SEMICONDUCTOR TECHNOLOGY ADVANCES have enabled designers to integrate more functionality in a single chip. As design complexity increases, many new design techniques are developed to optimize chip area and power consumption, as well as performance. Traditionally, yield improvement has been achieved through process improvement. However, in deep-submicron technologies, process variations are difficult to control. As a result, many design decisions significantly affect yield. Therefore, designers should consider … Show more

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Cited by 10 publications
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