The crack growth in metal materials under variable amplitude loading is influenced by interaction effects due to the random sorting of different load levels. The simulation of crack growth under such conditions is difficult. The Strip Yield Model (SYM) is widely used. Under certain loading sequences, the thickness effect of the specimen appears, resulting in different crack growths. The crack growth in M(T) specimens with different thicknesses made from 7475-T7351 and 2124-T851 plate materials was investigated using two flight loading sequences. During the tests, the thickness effect occurred in the case of AA 7475, but not in the case of AA 2124. The original SYM is not sensitive to specimen thickness; therefore, the modification was implemented based on the variable constraint factor a according to the FE analysis of the M(T) specimen. The crack-growth curves for AA 7475 determined by the modified SYM show dependency on the thickness and behave similarly to the test curves. The thinnest specimen (2 mm) shows a 150 % longer life than the thickest one (8 mm). In AA 2124, no thickness influence was observed for both the SYM prediction and the experimental results. The only exception was a slightly longer life predicted for the thinnest specimen. Using the modified SYM, the dependency on the thickness appeared similar to that obtained through experimental observations.