Young’s Modulus and Energy Dissipation Determination Methods by AFM, with Particular Reference to a Chalcogenide Thin Film

Kámán, Judit

doi:10.3311/ppee.7865

Cited by 11 publications

(6 citation statements)

References 24 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The adhesion energy of a single gold colloidal particle to the surface of the PLL-coated silicon nitride membrane was measured by using a SP400 atomic force microscope (Seiko Instruments, Japan) with a cantilever, which had a gold-coated probe with a diameter of 60 nm (BL-RC150VB-C1, Olympus, Japan). The adhesion energy of the gold colloidal particle to the membrane was estimated by measuring the force-distance curve between the probe and the membrane according to a literature 42 .…”

Section: Methodsmentioning

confidence: 99%

Shot-by-shot characterization of focused X-ray free electron laser pulses

Kobayashi

Sekiguchi

Oroguchi

et al. 2018

Sci Rep

View full text Add to dashboard Cite

X-ray free electron lasers (XFEL) provide intense and almost coherent X-ray pulses. They are used for various experiments investigating physical and chemical properties in materials and biological science because of their complete coherence, high intensity, and very short pulse width. In XFEL experiments, specimens are irradiated by XFEL pulses focused by mirror optics. The focused pulse is too intense to measure its coherence by placing an X-ray detector on the focal spot. Previously, a method was proposed for evaluating the coherence of focused pulses from the visibility of the diffraction intensity of colloidal particles by the speckle visibility spectroscopy (SVS). However, the visibility cannot be determined exactly because the diffraction intensity is integrated into each finite size detector pixel. Here, we propose a method to evaluate the coherence of each XFEL pulse by using SVS in combination with a theory for exact sampling of the diffraction pattern and a technique of multiplying the diffraction data by a Gaussian masks, which reduces the influence of data missing in small-angle regions due to the presence of a direct beamstop. We also introduce a method for characterizing the shot-by-shot size of each XFEL pulse by analysing the X-ray irradiated area.

show abstract

Section: Methodsmentioning

confidence: 99%

Shot-by-shot characterization of focused X-ray free electron laser pulses

Kobayashi

Sekiguchi

Oroguchi

et al. 2018

Sci Rep

View full text Add to dashboard Cite

show abstract

“…However, under the actually experimental conditions they do not coincide and the area between the two curves shows the amount of energy loss. Knowing the amount of energy dissipation helps to obtain a more accurate manipulation method [23,24]. Another property which can be extracted from the force-depth curve is the stiffness coefficient.…”

Section: Extractive Properties Of the Extend And Retract Curvesmentioning

confidence: 99%

The head and neck cancer (HN-5) cell line properties extraction by AFM

2020

View full text Add to dashboard Cite

This work incorporates experimental methods based on Atomic Force Microscopy (AFM) in order to extract the physical and mechanical characteristics of the head and neck cancer (HN-5) cell line such as cell topography, modulus of elasticity and viscoelastic properties. The initial parameters to determine the mechanical properties are obtained by extracting information from cantilever's force-displacement curve and vertical and horizontal displacement. Next, the changes in elasticity modulus at different points in the cell are attained using the experimental results, followed by studying the differences of these properties at various spots of the cell. Furthermore, cellular folding factor is calculated as a significant property in diagnosing the extent of cancer progression. Moreover, parameters such as adhesion and intermolecular forces are measured which are involved in the first phase of manipulation and during the application of the cantilever force to the particle. Finally, after calculating the indentation depth and contact radius using contact theories, critical manipulation time and force are obtained. Through modeling the cell, the creep function, the spring constant and the damping coefficient corresponding to the cell, are also extracted.

show abstract

“…The chemical interaction is measured by the deflection of the AFM cantilever during the AFM tip approach and withdrawal [16]. The deflection can be converted into the force needed to pull the functionalized AFM tip from the sample using the spring constant of the cantilever and Hooke's law [17]. The AFM probe pull-off force during withdrawal from the sample can be quantified as a measurement of adhesion force [16,17] and can be used to compare the surface chemistry of samples [9,[18][19][20][21].…”

mentioning

confidence: 99%

Single-Particle Chemical Force Microscopy to Characterize Virus Surface Chemistry

Heldt

2020

BioTechniques

View full text Add to dashboard Cite

Two important viral surface characteristics are the hydrophobicity and surface charge, which determine the viral colloidal behavior and mobility. Chemical force microscopy allows the detection of viral surface chemistry in liquid samples with small amounts of virus sample. This single-particle method requires the functionalization of an atomic force microscope (AFM) probe and covalent bonding of viruses to a surface. A hydrophobic methyl-modified AFM probe was used to study the viral surface hydrophobicity, and an AFM probe terminated with either negatively charged carboxyl acid or positively charged quaternary amine was used to study the viral surface charge. With an understanding of viral surface properties, the way in which viruses interact with the environment can be better predicted.

show abstract

Young’s Modulus and Energy Dissipation Determination Methods by AFM, with Particular Reference to a Chalcogenide Thin Film

Cited by 11 publications

References 24 publications

Shot-by-shot characterization of focused X-ray free electron laser pulses

Shot-by-shot characterization of focused X-ray free electron laser pulses

The head and neck cancer (HN-5) cell line properties extraction by AFM

Single-Particle Chemical Force Microscopy to Characterize Virus Surface Chemistry

Contact Info

Product

Resources

About