2008
DOI: 10.1049/el:20083215
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ZnO transparent thin-film transistors with HfO 2 /Ta 2 O 5 stacking gate dielectrics

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Cited by 8 publications
(4 citation statements)
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“…2a–c). Reported results on TSO MISFETs 6, 5, 20–22, 32–100 are compiled in Table 1. On/off current ratio and mobility for these devices are visualized in Fig.…”
Section: Tso Transistorsmentioning
confidence: 99%
“…2a–c). Reported results on TSO MISFETs 6, 5, 20–22, 32–100 are compiled in Table 1. On/off current ratio and mobility for these devices are visualized in Fig.…”
Section: Tso Transistorsmentioning
confidence: 99%
“…For display applications, ZnO-based TFTs are highly attractive owing to their transparency and higher field effect mobility compared with conventional amorphous silicon TFTs. [1][2][3][4][5][6][7][8] A low-temperature (<450 C) process is another basic requirement for fabrication of ZnO-based TFTs for future flexible or invisible display applications. ZnO-based TFTs have been fabricated using various low-temperature deposition techniques, such as RF-sputtering, 3) atomic layer deposition, 4) pulsed laser deposition, 7) and chemical solution deposition.…”
Section: Introductionmentioning
confidence: 99%
“…8) To improve their electrical properties, ZnObased TFTs may be fabricated with substrate heating (100 -300 C) [5][6][7] or following a post-thermal annealing process (100 -350 C). 2,7,8) Besides, to reduce operating voltage and for possible process integration, a high-k gate dielectric has become the major candidate of ZnO TFTs. [2][3][4][5][6][7][8][9][10] Deleterious chemical interactions at the dielectric/semiconductor interface were predicted to be suppressed because of the fact that the ZnO thin film and the high-k gate dielectric are both oxide-based materials.…”
Section: Introductionmentioning
confidence: 99%
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