Introduction. Periodic geodetic observations are used to control the position of building structures and soil massifs. Since tilt is considered to be one of the most dangerous types of building deformations, this paper considers existing methods for its determination. When a horizontal displacement (tilt) is detected, it is of particular importance to assess not so much its angle but its direction. This allows preventive measures to be timely enforced. Therefore, determination of the direction of horizontal displacements at small tilt angles presents a relevant research problem. In order to increase the sensitivity of the considered measuring device, it is proposed to use the action of electric field.Aim. Calculation of electrical voltages that ensure reliable operation of the device under consideration, depending on its geometric dimensions and characteristics of the materials used.Materials and methods. The device was made of conductive, semiconductive and dielectric materials. Calculations were based on an analysis of forces acting on a vertically suspended load in the presence of electric field. The conditions of equilibrium and instability of the position of the load arising due to strong positive feedback in electric field were considered.Results. Calculations were performed to support a reasonable choice of geometric and electrophysical characteristics of the developed device. A formula was obtained for the values of electrical voltages that could ensure troublefree operation of the device. The calculated values of operating voltages were found to be acceptable for practical application. The main structural elements of the device and one of the possible methods for registering information signals were proposed.Conclusion. Due to the instable position of the load in a sufficiently strong electric field, the developed device allows the direction of displacements to be measured even when their values tend to zero. This makes the developed device promising for practical application. However, it should be noted that, under such small displacements, the accuracy of the device depends on the manufacturing conditions and random factors.
