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The results of a characterisation carried out on thick film resistors (TFRs) with dimensions reduced below the usual limits are reported in this paper. The test vehicle was a purpose‐designed test pattern with resistors whose dimensions reached a limit of 0·3 mm in length and 0·4 mm in width. The proposed aim of the work was to look for dimensional limits where TFRs could still give acceptable performances, though, if possible, keeping unchanged the materials system and the process conditions which are used in the authors' thick film hybrids facility.

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