The possibility of measuring the dimensions of opaque micro-scale objects by using their fringe patterning is shown. A method of pixel-by-pixel holography image processing by a graphical editor for micro-object dimension measurement from the known value of fringe pattern period is investigated. The advantages of holographic recording on photo-thermoplastic media with resolution power up to 4000 mm −1 are discussed.

The polymer/As-Se-S-Sn structure for X-ray imaging has been investigated. The possibility of registering relief-phase images for X-ray radiation of 0,154 nm was shown.

No abstract

No abstract

No abstract