This article presents a derivation of the effective optical constants of a bilayer using the characteristic matrix technique. The derivation is simple, and in essence, adds an extra step to an approximate treatment of near-normal incidence spectroscopy, based on the characteristic matrix technique for stratified media. By this method, the effective optical constants of a bilayer consisting of two thin layers, each with a thickness much less than the wavelength of the incident radiation, are determined. This step leads to a modified procedure for calculating the optical properties of a layered stack that consists of thin bilayer units. The method, though still an effective medium approximation, is distinct from previous approximations. It introduces a more consistent parallelism to the fundamental theory of the characteristic matrix technique, and leads to a simplified analog of a multilayer viewed as one system of definite effective optical constants. Such a task has been difficult to achieve for structures with an arbitrary number of layers.

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Ultrathin multilayer structures of successive silver and silicon monoxide layer pairs are prepared using evaporation techniques. Small angle X-ray diffraction and multiple reflection interferometric techniques are used to establish the identity periods of samples. A review of the electrical properties is presented. Both applied voltage and thermally induced resistance switching are observed. These phenomena are described from an empirical vantage. Mittels Aufdampftechnik werden ultradunne Mehrschichtstrukturen von aufeinanderfolgendenSilber-und Siliziummonoxidschichtpaaren prapariert. Rontgen-Kleinwinkelbeugung und Mehrfachreflexions-Interferometertechnik werden benutzt, um die identischen Perioden der Proben festzustellen. Eine Ubersicht der elektrischen Eigenschaften wird angegeben. Sowohl durch LuBere Spannung als auch thermisch induziertes Widerstandumschalten wird beobachtet. Diese Erscheinung wird vom empirischen Standpunkt aus beschrieben.