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Abstract-We present a new formulation to implement the complex frequency shifted-perfectly matched layer (CFS-PML) for boundary truncation in 2-D vector finite-element time-domain method directly applied to Maxwell's equations. It is shown that the proposed method is highly absorptive to evanescent modes when computing the wave interaction of elongated structures or sharp corners. The impact of the CFS-PML parameters on the reflection error is investigated and optimal choices of these parameters are derived.Index Terms-Absorbing boundary conditions (ABC), finiteelement time-domain (FETD) method, Maxwell's equations, perfectly matched layer (PML).

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The signaling capacity of traces on the popular PCB dielectric.material FR4 is under-utilized today by at least one order of magnitude through the choice of pre-coding, pulseshaping, equalization, and receiver architecture. This paper determines the channel capacity of FX4 traces of various length in the presence of noise and crosstalk, and explores capacity limits based on signaling schemes such as 4-level PAM.

The predictive simulation of the formation of voids in interconnect lines is important for improving capacitance and timing in current memory cells. The cells considered are used in wireless applications such as cell phones, pagers, radios, handheld games, and GPS systems. In backend processes for memory cells, ild (interlayer dielectric) materials and processes result in void formation during gap fill. This approach lowers the overall k-value of a given metal layer and is economically advantageous. The effect of the voids on the overall capacitive load is tremendous. In order to simulate the shape and positions of the voids and thus the overall capacitance, the topography simulator elsa (Enhanced Level Set Applications) has been developed which consists of three modules, a level set module, a radiosity module, and a surface reaction module. The deposition process considered is deposition of silicon nitride. Test structures of interconnect lines of memory cells were fabricated and several sem images thereof were used to validate the corresponding simulations.