Phase or spatial resolution of secondary electron monitors for, respectively, longitudinal or transverse bunch charge distribution measurements are restricted by the space charge effect of both a primary beam and secondary electron one. Simulation results of the effect in the monitors in an approach of ellipsoidal bunches of the primary beam with uniform charge density and taking into account the field of charges induced by the beam will be presented.

Methods for longitudinal bunch charge distribution monitoring can be divided onto two groups: the usings of coherent or incoherent radiation of the bunch electrons. The former can be used for estimation of the rms bunch length, and the latter -for the bunch charge distribution measurements. Methods of the bunch distribution monitoring with subpicosecond resolution based on use of secondary electrons, transition, Cherenkov or bremsstrahlung radiation are considered.

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For reaching temporal resolution of about 1 fs in a time converting chronography of pulsed photon radiation in a range of visible light a new principle in the chronography consisting in simultaneous acceleration and longitudinal modulation of photoelectrons for the shortest time (about 1 ps) and at the moment of their escaping from a photocathode are proposed and considered. Photoelectron camera realizing the new principles and using the gold photocathode for soft-x-ray pulse registration with temporal resolution of 100 fs at the photoelectron bunch population of about 1000 electrons will be also discussed.

Analysis of main limitations on time resolution inhering in techniques for bunch length or bunch phase distribution monitoring with resolution in subpicosecond range, and also expressions for longitudinal aberrations of main optical elements in technique like a streak camera will be presented. Possibility of realization of the last with the resolution of about 0.01ps and less is discussed.