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Abstract. Cu 6 PS 5 I-based thin films were deposited onto silicate glass substrates by magnetron sputtering. With Cu content increase, a red shift of the optical transmission spectra as well as increase of the total electric conductivity are observed. A typical Urbach bundle are revealed, the temperature behaviour of the Urbach absorption edge in thin films are explained by strong electron-phonon interaction. Temperature dependences of the absorption edge energy position and the Urbach energy for thin film are well described in Einstein model. The influence of different type of disordering on the Urbach tail is studied.

Abstract. Cu 6 PS 5 I-based thin films are deposited onto silicate-glass substrates using magnetron sputtering. Their chemical compositions are determined with the aid of energy-dispersive X-ray spectroscopy. Changes in the Raman spectra of the Cu 6 PS 5 I-based thin films with respect to the spectra typical for crystalline Cu 6 PS 5 I are discussed. Optical absorption spectra and refractive indices for the films with different Cu contents are studied. Decrease in the energy pseudogap and the Urbach energy is observed with increasing Cu content, accompanied by increase in the refractive index. Electrical conductivity of the Cu 6 PS 5 I-based thin films is revealed to increase nonlinearly with increasing copper concentration.

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