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A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X-ray diffraction spectra is presented. It uses the maximumtexture-entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated through two model examples.

A pole figure needs generally more than 2000 points of measurement, each point corresponding to a specific location of the sample in space. For each position, the detected intensity will depend on the irradiated volume,

A so-called “Vector Method” for the texture analysis of cubic materials was presented for the first time at this conference in 1976. Since then this method has been refined and applied successfully to non cubic-materials. It is shown in this paper that the Vector Method provides several advantages over series methods of texture analysis, the most important of which being the relatively small amount of experimental data which are needed for the determination of the entire crystallite orientation distribution.

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