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To evaluate magnetic fields radiated by electronic components, different radiated emission models have been created. Within IRSEEM, a model based on equivalent sources obtained from near-field measurements has been developed. The aim of our study is to insert this model into commercial electromagnetic tools such as HFSS to make it helpful for engineers.

Abstract-In this paper, a parametric electromagnetic radiated emission model has been explored. Several mathematical improvements with respect to its extraction and computational performance have been deployed. The model, represented with an array of radiating electric dipoles, predicts the electromagnetic emission of components and systems. Core-level changes have been made in order to extract the model parameters: the dipole positions, their orientations and currents, and the effective relative permittivity from near-field measurements. Thresholding and windowing techniques are used to detect and optimize dipole positions, directly from the field data. A fast and memory efficient two-level optimization algorithm based on the LevenbergMarquardt non-linear least squares technique is implemented for parametric extraction. All the constraints of the previous model have been overcome and the system is validated for mono-substrate and multisubstrate devices from measurements and/or simulations, with promising results. A tremendous improvement in modeling capability and performance has been obtained when compared with that of its erstwhile counterpart.

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A new international standard proposal (IEC 62433-2 Edition 2.0) is in progress. The main purpose of the standard is to provide an Integrated Circuit Emission Model -Conducted Emission (ICEM-CE) along with a data exchange format. It is known that the existing ICEM-CE information is closely linked to the supplier of the model or simulation software used to generate the model information, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. This paper describes a universal exchange format for ICEM-CE. The format is based on the well-known eXtensible Markup Language format, which is both machine and human readable. As an illustrative example, it is applied on an Atmega88 microcontroller: the model is extracted by the manufacturer, Atmel, and is exchanged with an academic partner, INSA, and an industrial partner, Valeo. The exchange proves fruitful and the model was easily deployable to predict conducted emission noise.