The main goal of this work was to implement a reliable machine learning algorithm that can classify a dog's age given only a photograph of its face. The problem, which seems simple for humans, presents itself as very difficult for the machine learning algorithms due to differences in facial features among the dog population. As convolutional neural networks (CNNs) performed poorly in this problem, the authors took another approach of creating novel architecture consisting of a combination of CNN and vision transformer (ViT) and examining the age of the dogs separately for every breed. Authors achieved better results than those in initial works covering the problem.
The main goal of this work was to experimentally verify the methods for a challenging task of categorization and clustering Polish text. Supervised and unsupervised learning was employed respectively for the categorization and clustering. A profound examination of the employed methods was done for the custom-built corpus of Polish texts. The corpus was assembled by the authors from Internet resources. The corpus data was acquired from the news portal and, therefore, it was sorted by type by journalists according to their specialization. The presented algorithms employ Vector Space Model (VSM) and TF-IDF (Term Frequency-Inverse Document Frequency) weighing scheme. Series of experiments were conducted that revealed certain properties of algorithms and their accuracy. The accuracy of algorithms was elaborated regarding their ability to match human arrangement of the documents by the topic. For both the categorization and clustering, the authors used F-measure to assess the quality of allocation.
Testing FPGA-based soft processor cores requires a completely different methodology in comparison to standard processors. The stuck-at fault model is insufficient, as the logic is implemented by lookup tables (LUTs) in FPGA, and this SRAM-based LUT memory is vulnerable to single-event upset (SEU) mainly caused by cosmic radiations. Consequently, in this paper, we used combined SEU-induced and stuck-at fault models to simulate every possible fault. The test program written in an assembler was based on the bijective property. Furthermore, the fault detection matrix was determined, and this matrix describes the detectability of every fault by every test vector. The major novelty of this paper is the optimal reduction in the number of required test vectors in such a way that fault coverage is not reduced. Furthermore, this paper also studied the optimal selection of test vectors when only 95% maximal fault coverage is acceptable; in such a case, only three test vectors are required. Further, local and global test vector selection is also described.
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