We present a unified density-based topology-optimization framework that yields integrated photonic designs optimized for manufacturing constraints including all those of commercial semiconductor foundries. We introduce a new method to impose minimum-area and minimum-enclosed-area constraints, and simultaneously adapt previous techniques for minimum linewidth, linespacing, and curvature, all of which are implemented without any additional re-parameterizations. Furthermore, we show how differentiable morphological transforms can be used to produce devices that are robust to over/under-etching while also satisfying manufacturing constraints. We demonstrate our methodology by designing three broadband silicon-photonics devices for nine different foundry-constraint combinations.
We present a photonics topology optimization (TO) package capable of addressing a wide range of practical photonics design problems, incorporating robustness and manufacturing constraints, which can scale to large devices and massive parallelism. We employ a hybrid algorithm that builds on a mature time-domain (FDTD) package Meep to simultaneously solve multiple frequency-domain TO problems over a broad bandwidth. This time/frequency-domain approach is enhanced by new filter-design sources for the gradient calculation and new material-interpolation methods for optimizing dispersive media, as well as by multiple forms of computational parallelism. The package is available as free/open-source software with extensive tutorials and multi-platform support.
We develop and experimentally validate a novel artificial neural network (ANN) design framework for silicon photonics devices that is both practical and intuitive. As case studies, we train ANNs to model both strip waveguides and chirped Bragg gratings using a small number of simple input and output parameters relevant to designers. Once trained, the ANNs decrease the computational cost relative to traditional design methodologies by more than 4 orders of magnitude. To illustrate the power of our new design paradigm, we develop and demonstrate both forward and inverse design tools enabled by the ANN. We use these tools to design and fabricate several integrated Bragg grating devices. The ANN's predictions match very well with the experimental measurements and do not require any post-fabrication training adjustments.
We present a novel silicon photonic parameter extraction tool that uses artificial neural networks. While other parameter extraction methods are restricted to relatively simple devices whose responses are easily modeled by analytic transfer functions, this method is capable of extracting parameters for any device with a discrete number of design parameters. To validate the method, we design and fabricate integrated chirped Bragg gratings. We then estimate the actual device parameters by iteratively fitting the simultaneously measured group delay and reflection profiles to the artificial neural network output. The method is fast, accurate, and capable of modeling the complicated chirping and index contrast.
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