Polymer microspheres for controlled release of therapeutic protein from within an implantable scaffold were produced and analysed using complimentary techniques to probe the surface and bulk chemistry of the microspheres. Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) surface analysis revealed a thin discontinuous film of polyvinyl alcohol (PVA) surfactant (circa 4.5 nm thick) at the surface which was readily removed under sputtering with C(60). Atomic Force Microscopy (AFM) imaging of microspheres before and after sputtering confirmed that the PVA layer was removed after sputtering revealing poly(lactic-co-glycolic) acid(PLGA). Scanning electron microscopy showed the spheres to be smooth with some shallow and generally circular depressions, often with pores in their central region. The occurrence of the protein at the surface was limited to areas surrounding these surface pores. This surface protein distribution is believed to be related to a burst release of the protein on dissolution. Analysis of the bulk properties of the microspheres by confocal Raman mapping revealed the 3D distribution of the protein showing large voids within the pores. Protein was found to be adsorbed at the interface with the PLGA oil phase following deposition on evaporation of the solvent. Protein was also observed concentrated within pores measuring approximately 2 μm across. The presence of protein in large voids and concentrated pores was further scrutinised by ToF-SIMS of sectioned microspheres. This paper demonstrates that important information for optimisation of such complex bioformulations, including an understanding of the release profile can be revealed by complementary surface and bulk analysis allowing optimisation of the therapeutic effect of such formulations.

In recent years, it has been demonstrated that cluster ion beams may be used to sputter some materials, particularly organic materials, without the significant accumulation of damage. It is therefore possible to use cluster ion beam sputtering in conjunction with a surface analytical technique, such as SIMS, to obtain depth profiles and three-dimensional images of the distribution of organic species in the near-surface region. For SIMS organic depth profiling to be useful as an analytical tool, it is important that it is able to measure physically meaningful quantities, such as the local concentration of a species within a blend. In this paper, we investigate a model system of a miscible binary mixture of codeine and poly(lactide). We show that there is a strong surface enrichment of poly(lactide), which provides a reference signal and permits the direct comparison of different samples in terms of secondary ion yield behavior. We demonstrate that it is possible to relate secondary ion intensities to local concentrations for a binary system and that there is a direct correspondence between the yield enhancement of one component and the yield suppression of the other. The dependence of secondary ion yield on composition is described using a model of the kinetically limited transfer of charge between secondary ions and secondary neutrals. Application of the model to pure materials under the assumption that only highly fragmented secondary ions are initially produced and interact with unfragmented secondary neutrals leads to the prediction that high molecular mass quasi-molecular ions have intensities proportional to the square of the total secondary ion yield. This relationship has been independently observed in other work (Seah, M. P. Surf. Interface Anal. 2007, 39, 634.).

With the widespread use of engineered nanoparticles for biomedical applications, detailed surface characterization is essential for ensuring reproducibility and the quality/suitability of the surface chemistry to the task at hand. One important surface property to be quantified is the overlayer thickness of self-assembled monolayer (SAM) functionalized nanoparticles, as this information provides insight into SAM ordering and assembly. We demonstrate the application of high sensitivity low energy ion scattering (HS-LEIS) as a new analytical method for the fast thickness characterization of SAM functionalized gold nanoparticles (AuNPs). HS-LEIS demonstrates that a complete SAM is formed on 16-mercaptohexadecanoic acid (C16COOH) functionalized 14 nm AuNPs. HS-LEIS also experimentally provides SAM thickness values that are in good agreement with previously reported results from simulated electron spectra for surface analysis (SESSA) analysis of X-ray photoelectron spectroscopy (XPS) data. These results indicate HS-LEIS is a valuable surface analytical method for the characterization of SAM functionalized nanomaterials.

Gold nanoparticles (AuNPs) with average diameters of ∼14 and ∼40 nm, as well as flat gold coated silicon wafers, were functionalized with oligo ethylene glycol (OEG) terminated 1-undecanethiol (HS-CH) self-assembled monolayers (SAMs). Both hydroxyl [(OEG)OH] and methoxy [(OEG)OMe] terminated SAMs were prepared. The AuNPs were characterized with transmission electron microscopy (TEM), time of flight secondary ion mass spectrometry (ToF-SIMS), x-ray photoelectron spectroscopy (XPS), attenuated total reflectance Fourier infrared spectroscopy (ATR-FTIR), and low-energy ion scattering (LEIS). These studies provided quantitative information about the OEG functionalized AuNPs. TEM showed the 14 nm AuNPs were more spherical and had a narrower size distribution than the 40 nm AuNPs. ToF-SIMS clearly differentiated between the two OEG SAMs based on the CHO peak attributed to the methoxy group in the OMe terminated SAMs as well as the different masses of the [Au + M] ion (M = mass of the thiol molecule) from each type of SAM. Overlayer/substrate ratios quantitatively determined with XPS show a greater proportion of OEG units at the surface of 40 nm AuNPs compared to the 14 nm AuNPs. ATR-FTIR suggested the C11 backbone of the two SAMs on both AuNPs are similar and crystalline, but the OEG head groups are more crystalline on the 40 nm AuNPs compared to the 14 nm AuNPs. This indicated a better ordered SAM present at the surface of the larger, more irregular particles due to greater ordering of the OEG groups. This was consistent with the XPS and LEIS results, which showed a 30% thicker SAM was formed on the 40 nm AuNPs compared to the 14 nm AuNPs. The OH or OMe functionality did not have a significant effect on the ordering and thickness of the OEG SAMs.