<p>To detect defects of solar panel and understand the effect of external parameters such as fluctuations in illumination, temperature, and the effect of a type of dust on a photovoltaic (PV) panel, it is essential to plot the Ipv=f(Vpv) characteristic of the PV panel, and the simplest way to plot this I-V characteristic is to use a variable resistor. This paper presents a study of comparison and combination between two methods: capacitive and electronic loading to track I-V characteristic. The comparison was performed in terms of accuracy, response time and instrumentation cost used in each circuit, under standard temperature and illumination conditions by using polycrystalline solar panel type SX330J and monocrystalline solar panels type ET-M53630. The whole system is based on simple components, less expensive and especially widely used in laboratories. The results will be between the datasheet of the manufacturer with the experimental data, refinements and improvements concerning the number of points and the trace time have been made by combining these two methods.</p>

To understand the electrical behavior of a photovoltaic panel, it is necessary to know the characteristic Ipv = f(Vpv). The best way to obtainthis I-V curve is to use a variable resistor. This paper proposes a new and simple technique based on a MOSFET transistor as a variable load, which whose gate voltage is controlled by an RC filter from the Arduino. A comparison under standard temperature and illumination conditions between the manufacturer’s datasheet with the simulation by MATLAB/Simulink on the one hand, and on the other hand between the manufacturer’s datasheet with the experimental data for the evaluation of this technique that has been performed.

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A maximum power point track (MPPT) circuit should be used to improve and maximize photovoltaic (PV) power production. Different algorithms are proposed in the literature, and it is imperative to compare them in order to identify which MPPT approach is best for a specific application or to provide recommendations for future MPPT research. This article presents <em>‎‎</em>a benchmarking of the most widely used MPPT algorithms, such as the <em>‎‎‎</em>perturbation and observe classic (POC), the perturbation and improved adaptive <em>‎‎</em>observer (POAM), the perturbation and observe modified (POM) as well as the <em>‎‎</em>combination of the POM and POAM algorithms called PAMM. The <em>‎‎</em>comparative study presented in this work will confirm that the PAMM is the <em>‎‎</em>best MPPT technic to improve the performance of a PV system.<em>‎</em>