We discuss the results of an extensive investigation on NiO ultrathin films grown on Pd(100), carried out by means of high-resolution X-ray photoelectron spectroscopy (core levels) and ultraviolet photoelectron spectroscopy (valence band levels). The peculiarity of the investigated system is the rather high lattice mismatch between NiO and the Pd substrate (7.3%). Detailed information on the electronic structure of NiO ultrathin films is obtained as a function of thickness, with a particular emphasis put on the fully wetting single c(4 × 2)-Ni 3 O 4 defective monolayer, up to the bulklike relaxed films, through the intermediate three-dimensional strained islands resulting from a Stranski-Krastanov growth behavior.
Pt–Sn alloys play an important role as oxygen reduction reaction (ORR) catalysts in fuel cell technology both for their role in rationalizing the mechanism responsible for the better performances of bimetallic catalysts and for their practical applications.\ud
Here we present a complete experimental and theoretical study on the geometric and electronic structure of a (4×1) termination over a Pt3Sn near-surface ordered alloy obtained by depositing Sn on the Pt(110) and subsequent annealing. LEED and STM measurements combined with DFT simulations, allow us to determine the atomistic structure of this phase, and to rationalize the peculiar dependence of its STM pattern on the applied bias and the compositional order in deep layers. Both photoemission\ud
experiments and density functional calculations indicate that in this phase the Sn-Pt alloying process determines important changes in the electronic properties, and in particular a relevant shift of the Pt 5d band centroid with respect to clean Pt
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