An approach is proposed for removing the wavefront curvature introduced by the microscope imaging objective in digital holography, which otherwise hinders the phase contrast imaging at reconstruction planes. The unwanted curvature is compensated by evaluating a correcting wave front at the hologram plane with no need for knowledge of the optial parameters, focal length of the imaging lens, or distances in the setup. Most importantly it is shown that a correction effect can be obtained at all reconstruction planes. Three different methods have been applied to evaluate the correction wave front and the methods are discussed in detail. The proposed approach is demonstrated by applying digital holography as a method of coherent microscopy for imaging amplitude and phase contrast of microstructures.

In this paper, we have investigated on the potentialities of digital holography for whole reconstruction of wavefields. We show that this technique can be efficiently used for obtaining quantitative information from the intensity and the phase distributions of the reconstructed field at different locations along the propagation direction. The basic concept and procedure of wavefield reconstruction for digital in-line holography is discussed. Numerical reconstructions of the wavefield from digitally recorded in-line hologram patterns and from simulated test patterns are presented. The potential of the method for analysing aberrated wave front has been exploited by applying the reconstruction procedure to astigmatic hologram patterns.

In microscopy, high magnifications are achievable for investigating micro-objects but the paradigm is that higher is the required magnification, lower is the depth of focus. For an object having a three-dimensional (3D) complex shape only a portion of it appears in good focus to the observer who is essentially looking at a single image plane. Actually, two approaches exist to obtain an extended focused image, both having severe limitations since the first requires mechanical scanning while the other one requires specially designed optics. We demonstrate that an extended focused image of an object can be obtained through digital holography without any mechanical scanning or special optical components. The conceptual novelty of the proposed approach lies in the fact that it is possible to completely exploit the unique feature of DH in extracting all the information content stored in hologram, amplitude and phase, to extend the depth of focus.

The searching and recovering of the correct reconstruction distance in digital holography (DH) can be a cumbersome and subjective procedure. Here we report on an algorithm for automatically estimating the in-focus image and recovering the correct reconstruction distance for speckle holograms. We have tested the approach in determining the reconstruction distances of stretched digital holograms. Stretching a hologram with a variable elongation parameter makes it possible to change the in-focus distance of the reconstructed image. In this way, the proposed algorithm can be verified at different distances by dispensing the recording of different holograms. Experimental results are shown with the aim of demonstrating the usefulness of the proposed method, and a comparative analysis has been performed with respect to other existing algorithms developed for DH.

Digital holographic microscopy (DHM) can be described as a non-invasive metrological tool for inspection and characterization of microelectromechanical structures (MEMS). DHM is a quick, non-contact and non-invasive technique that can offer a high resolution in both lateral and vertical directions. It has been employed for the characterization of the undesired out-of-plane deformations due to the residual stresses introduced by technological processes. The characterization of these deformations is helpful in studying and understanding the effect of residual stress on the deformation of a single microstructure. To that end, MEMS with different geometries and shapes, such as cantilever beams, bridges and membranes, have been characterized. Moreover, DHM has been applied efficiently to evaluate variations of the structure profile due to some external effects. As an example, the characterization of a cantilever subjected to a thermal process has been described. The results reported show that DHM is a useful non-invasive method for characterizing and developing reliable MEMS.